Datasheet

LMP2231
www.ti.com SNOSB01E –JANUARY 2008–REVISED MARCH 2013
Operating Ratings
(1)
Operating Temperature Range
(2)
−40°C to 125°C
Supply Voltage (V
S
= V
+
- V
−
) 1.6V to 5.5V
Package Thermal Resistance (θ
JA
)
(2)
5-Pin SOT-23 160.6 °C/W
8-Pin SOIC 116.2 °C/W
(1) Absolute Maximum Ratings indicate limits beyond which damage may occur. Operating Ratings indicate conditions for which the device
is intended to be functional, but specific performance is not ensured. For ensured specifications and test conditions, see the Electrical
Characteristics.
(2) The maximum power dissipation is a function of T
J(MAX)
, θ
JA
. The maximum allowable power dissipation at any ambient temperature is
P
D
= (T
J(MAX)
– T
A
)/ θ
JA
. All numbers apply for packages soldered directly onto a PC Board.
5V DC Electrical Characteristics
(1)
Unless otherwise specified, all limits ensured for T
A
= 25°C, V
+
= 5V, V
−
= 0V, V
CM
= V
O
= V
+
/2, and R
L
> 1 MΩ. Boldface
limits apply at the temperature extremes.
Symbol Parameter Conditions Min
(2)
Typ
(3)
Max
(2)
Units
V
OS
Input Offset Voltage ±10 ±150 μV
±230
TCV
OS
Input Offset Voltage Drift LMP2231A ±0.3 ±0.4 μV/°C
LMP2231B ±0.3 ±2.5
I
BIAS
Input Bias Current 0.02 ±1
pA
±50
I
OS
Input Offset Current 5 fA
CMRR Common Mode Rejection Ratio 0V ≤ V
CM
≤ 4V 81 97
dB
80
PSRR Power Supply Rejection Ratio 1.6V ≤ V
+
≤ 5.5V 83 120
dB
V
−
= 0V, V
CM
= 0V 83
CMRR ≥ 80 dB −0.2 4.2
CMVR Common Mode Voltage Range V
CMRR ≥ 79 dB −0.2 4.2
V
O
= 0.3V to 4.7V 110
A
VOL
Large Signal Voltage Gain 120 dB
R
L
= 10 kΩ to V
+
/2 108
V
O
Output Swing High R
L
= 10 kΩ to V
+
/2 17 50 mV
V
IN
(diff) = 100 mV 50 from either
rail
Output Swing Low R
L
= 10 kΩ to V
+
/2 17 50
V
IN
(diff) = −100 mV 50
I
O
Output Current
(4)
Sourcing, V
O
to V
–
27 30 mA
V
IN
(diff) = 100 mV 19
Sinking, V
O
to V
+
17 22
V
IN
(diff) = −100 mV 12
I
S
Supply Current 10 16
µA
18
(1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that T
J
= T
A
. No ensured specification of parametric performance is indicated in the electrical
tables under conditions of internal self-heating where T
J
> T
A
. Absolute Maximum Ratings indicate junction temperature limits beyond
which the device may be permanently degraded, either mechanically or electrically.
(2) All limits are specified by testing, statistical analysis or design.
(3) Typical values represent the most likely parametric norm at the time of characterization. Actual typical values may vary over time and
will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped production
material.
(4) The short circuit test is a momentary open loop test.
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