Datasheet

LMP2021, LMP2022
www.ti.com
SNOSAY9E SEPTEMBER 2008REVISED MARGH 2013
Operating Ratings
(1)
Temperature Range 40°C to 125°C
Supply Voltage (V
S
= V
+
– V
) 2.2V to 5.5V
Package Thermal Resistance (θ
JA
) 5-Pin SOT-23 164 °C/W
8-Pin SOIC (LMP2021) 106 °C/W
8-Pin SOIC (LMP2022) 106 °C/W
8-Pin VSSOP 217 °C/W
(1) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for
which the device is intended to be functional, but specific performance is not ensured. For ensured specifications and the test
conditions, see the Electrical Characteristics Tables.
2.5V Electrical Characteristics
(1)
Unless otherwise specified, all limits are ensured for T
A
= 25°C, V
+
= 2.5V, V
= 0V, V
CM
= V
+
/2, R
L
>10 k to V
+
/2. Boldface
limits apply at the temperature extremes.
Symbol Parameter Conditions Min
(2)
Typ
(3)
Max
(2)
Units
V
OS
Input Offset Voltage –0.9 ±5
μV
±10
TCV
OS
Input Offset Voltage Drift
(4)
0.001 ±0.02 μV/°C
I
B
Input Bias Current ±23 ±100
pA
±300
I
OS
Input Offset Current ±57 ±200
pA
±250
CMRR Common Mode Rejection Ratio 0.2V V
CM
1.7V 105
141 dB
0V V
CM
1.5V 102
CMVR Input Common-Mode Voltage Range Large Signal CMRR 105 dB 0.2 1.7
V
Large Signal CMRR 102 dB 0 1.5
EMIRR Electro-Magnetic Interference V
RF-PEAK
= 100 mV
P
(20 dBV
P
) 40
Rejection Ratio
(5)
f = 400 MHz
V
RF-PEAK
= 100 mV
P
(20 dBV
P
) 48
IN+
f = 900 MHz
and dB
V
RF-PEAK
= 100 mV
P
(20 dBV
P
) 67
IN
f = 1800 MHz
V
RF-PEAK
= 100 mV
P
(20 dBV
P
) 79
f = 2400 MHz
PSRR Power Supply Rejection Ratio 2.5V V
+
5.5V, V
CM
= 0 115 130
112
dB
2.2V V
+
5.5V, V
CM
= 0 110 130
A
VOL
Large Signal Voltage Gain R
L
= 10 k to V
+
/2 124 150
V
OUT
= 0.5V to 2V 119
dB
R
L
= 2 k to V
+
/2 120 150
V
OUT
= 0.5V to 2V 115
(1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that T
J
= T
A
. No specification of parametric performance is indicated in the electrical tables under
conditions of internal self-heating where T
J
> T
A
.
(2) All limits are specified by testing, statistical analysis or design.
(3) Typical values represent the most likely parametric norm at the time of characterization. Actual typical values may vary over time and
will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped production
material.
(4) Offset voltage temperature drift is determined by dividing the change in V
OS
at the temperature extremes by the total temperature
change.
(5) The EMI Rejection Ratio is defined as EMIRR = 20Log ( V
R
F-PEAK
/ΔV
OS
).
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