Datasheet

LMH6714, LMH6720
LMH6722, LMH6722-Q1
www.ti.com SNOSA39G –NOVEMBER 2002–REVISED APRIL 2013
Operating Ratings
(1)
Thermal Resistance Package (θ
JA
)
5-Pin SOT-23 (DBV) 232°C/W
6-Pin SOT-23 (DBV) 198°C/W
8-Pin SOIC (D) 145°C/W
14-Pin SOIC (D) 130°C/W
14-Pin TSSOP (PW) 160°C/W
14-Pin WSON (NHK) 46°C/W
Operating Temperature LMH6722Q −40°C to 125°C
All others −40°C to 85°C
Supply Voltage Range 8V (±4V) to 12.5V (±6.25V)
(1) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for
which the device is intended to be functional, but specific performance is not ensured. For specific specifications, see the Electrical
Characteristics tables.
Electrical Characteristics
Unless specified, A
V
= +2, R
F
= 300Ω: V
CC
= ±5V, R
L
= 100Ω, LMH6714/LMH6720/LMH6722. Boldface limits apply at
temperature extremes.
Symbol Parameter Conditions Min
(1)
Typ
(2)
Max
(1)
Units
Frequency Domain Response
SSBW −3dB Bandwidth V
OUT
= 0.5V
PP
345 400 MHz
LSBW −3dB Bandwidth V
OUT
= 2.0V
PP
200 250 MHz
LSBW −3dB Bandwidth, LMH6722 V
OUT
= 2.0V
PP
170 250 MHz
TSSOP package only
Gain Flatness V
OUT
= 2V
PP
GFP Peaking DC to 120MHz 0.1 dB
GFR Rolloff DC to 120MHz 0.1 dB
LPD Linear Phase Deviation DC to 120MHz 0.5 deg
DG Differential Gain R
L
= 150Ω, 4.43MHz (LMH6714) 0.01 %
DG Differential Gain R
L
= 150Ω, 4.43MHz (LMH6720) 0.02 %
DP Differential Phase R
L
= 150Ω, 4.43MHz 0.01 deg
Time Domain Response
TRS Rise and Fall Time .5V Step 1.5 ns
TRL 2V Step 2.6 ns
t
s
Settling Time to 0.05% 2V Step 12 ns
SR Slew Rate 6V Step 1200 1800 V/µs
Distortion and Noise Response
HD2 2nd Harmonic Distortion 2V
PP
, 20MHz −58 dBc
HD3 3rd Harmonic Distortion 2V
PP
, 20MHz −70 dBc
IMD 3rd Order Intermodulation 10MHz, P
OUT
= 0dBm −78 dBc
Products
Equivalent Input Noise
VN Non-Inverting Voltage >1MHz 3.4 nV/√Hz
NICN Inverting Current >1MHz 10 pA/√Hz
ICN Non-Inverting Current >1MHz 1.2 pA/√Hz
(1) All limits are specified by testing, design, or statistical analysis.
(2) Typical values represent the most likely parametric norm at the time of characterization. Actual typical values may vary over time and
will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped production
material.
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