Datasheet

LMH6550
www.ti.com
SNOSAK0H DECEMBER 2004REVISED MARCH 2013
±5V Electrical Characteristics
(1)
Single ended in differential out, T
A
= 25°C, V
S
= ±5V, V
CM
= 0V, R
F
= R
G
= 365, R
L
= 500; Unless specified. Boldface
limits apply at the temperature extremes.
Symbol Parameter Conditions Min
(2)
Typ
(3)
Max
(2)
Units
AC Performance (Differential)
SSBW Small Signal 3 dB Bandwidth V
OUT
= 0.5 V
PP
400 MHz
LSBW Large Signal 3 dB Bandwidth V
OUT
= 2 V
PP
380 MHz
Large Signal 3 dB Bandwidth V
OUT
= 4 V
PP
320 MHz
0.1 dB Bandwidth V
OUT
= 0.5 V
PP
90 MHz
Slew Rate 4V Step
(4)
2000 3000 V/μs
Rise/Fall Time 2V Step 1 ns
Settling Time 2V Step, 0.1% 8 ns
V
CM
Pin AC Performance (Common Mode Feedback Amplifier)
Common Mode Small Signal V
CM
Bypass Capacitor Removed 210 MHz
Bandwidth
Slew Rate V
CM
Bypass Capacitor Removed 200 V/µs
Distortion and Noise Response
HD2 2
nd
Harmonic Distortion V
O
= 2 V
PP
, f = 5 MHz, R
L
= 800 92
V
O
= 2 V
PP
, f = 20 MHz, R
L
= 800 78 dBc
V
O
= 2 V
PP
, f = 70 MHz, R
L
= 800 59
HD3 3
rd
Harmonic Distortion V
O
= 2 V
PP
, f = 5 MHz, R
L
= 800 103
V
O
= 2 V
PP
, f = 20 MHz, R
L
= 800 88 dBc
V
O
= 2 V
PP
, f = 70 MHz, R
L
= 800 50
e
n
Input Referred Voltage Noise f 1 MHz 6.0 nV/Hz
i
n
Input Referred Noise Current f 1 MHz 1.5 pA/Hz
Input Characteristics (Differential)
V
OSD
Input Offset Voltage Differential Mode, V
ID
= 0, V
CM
= 0 1 ±4 mV
±6
Input Offset Voltage Average
(5)
1.6 µV/°C
Temperature Drift
I
BI
Input Bias Current
(6)
0 -8 16 µA
Input Bias Current Average
(5)
9.6 nA/°C
Temperature Drift
Input Bias Difference Difference in Bias Currents Between the 0.3 µA
Two Inputs
CMRR Common Mode Rejection Ratio DC, V
CM
= 0V, V
ID
= 0V 72 82 dBc
R
IN
Input Resistance Differential 5 M
C
IN
Input Capacitance Differential 1 pF
CMVR Input Common Mode Voltage Range CMRR > 53 dB +3.1 +3.2
V
4.6 4.7
V
CM
Pin Input Characteristics (Common Mode Feedback Amplifier)
V
OSC
Input Offset Voltage Common Mode, V
ID
= 0 1 ±5 mV
±8
Input Offset Voltage Average
(5)
25 µV/°C
Temperature Drift
Input Bias Current
(6)
2 μA
(1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that T
J
= T
A
. No guarantee of parametric performance is indicated in the electrical tables under
conditions of internal self-heating where T
J
> T
A
.
(2) Limits are 100% production tested at 25°C. Limits over the operating temperature range are guaranteed through correlation using
Statistical Quality Control (SQC) methods.
(3) Typical numbers are the most likely parametric norm.
(4) Slew Rate is the average of the rising and falling edges.
(5) Drift determined by dividing the change in parameter at temperature extremes by the total temperature change.
(6) Negative input current implies current flowing out of the device.
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