Datasheet

LMC7221
www.ti.com
SNOS748E SEPTEMBER 1999REVISED MARCH 2013
2.7V Electrical Characteristics (continued)
Unless otherwise specified, all limits ensured for T
J
= 25°C, V
+
= 2.7V, V
= 0V, V
CM
= V
O
= V
+
/2. Boldface limits apply at the
temperature extremes.
Parameter Test Conditions LMC7221AI LMC7221BI Units
Typ
(1)
Limit
(2)
Limit
(2)
A
V
Voltage Gain 100 dB
CMVR Input Common-Mode Voltage CMRR > 55 dB 3.0 2.9 2.9 V
Range
2.7 2.7 min
CMRR > 55 dB 0.3 0.2 0.2 V
0.0 0.0 max
V
OL
Output Voltage Low I
LOAD
= 2.5 mA 0.2 0.3 0.3 V
0.4 0.4 max
I
S
Supply Current V
OUT
= Low 7 12 12 μA
14 14 max
5.0V and 15.0V Electrical Characteristics
Unless otherwise specified, all limits ensured for T
J
= 25°C, V
+
= 5.0V and 15V, V
= 0V, V
CM
= V
O
= V
+
/2. Boldface limits
apply at the temperature extremes.
Parameter Test Conditions LMC7221AI LMC7221BI Units
Typ
(1)
Limit
(2)
Limit
(2)
V
OS
Input Offset Voltage 3 5 15 mV
8 18 max
TCV
OS
Input Offset Voltage Temperature V
+
= 5V 1.0
μV/°C
Drift
V
+
= 15V 4.0
Input Offset Voltage Average Drift V
+
= 5V
(3)
3.3
μV/Month
V
+
= 15V
(3)
4.0
I
B
Input Current 0.04 pA
I
OS
Input Offset Current 0.02 pA
CMRR Common Mode Rejection Ration V
+
= 5.0V 75 dB
V
+
= 15.0V 82 dB
PSRR Power Supply Rejection Ratio 5V V
+
10V 80 dB
A
V
Voltage Gain 100 dB
CMVR Input Common-Mode Voltage V
+
= 5.0V 5.3 5.2 5.2 V
Range CMRR > 55 dB
5.0 5.0 min
V
+
= 5.0V 0.3 0.2 0.2 V
CMRR > 55 dB
0.0 0.0 max
V
+
= 15.0V 15.3 15.2 15.2 V
CMRR > 55 dB
15.0 15.0 min
V
+
= 15.0V 0.3 0.2 0.2 V
CMRR > 55 dB
0.0 0.0 max
V
OL
Output Voltage Low V
+
= 5V 0.2 0.40 0.40 mV
I
LOAD
= 5 mA
0.55 0.55 max
V
+
= 15V 0.2 0.40 0.40 mV
I
LOAD
= 5 mA
0.55 0.55 max
I
S
Supply Current V
OUT
= Low 7 14 14 μA
18 18 max
(1) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped
production material.
(2) All limits are specified by testing or statistical analysis.
(3) C
L
includes the probe and test jig capacitance.
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