Datasheet

V
DD IO
GND
SI/O
LM95172EWG
CS
SC
V
DD ANALOG
V
DD IO
Microcontroller
3.0 to 5.5 Volts
GND
R
PULL-UP
10k
OVERTEMP
OVERTEMP
LM95172
www.ti.com SNOSB33B –DECEMBER 2009–REVISED MARCH 2013
Typical Application
Figure 2. Microcontroller Interface - normal connection
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
Absolute Maximum Ratings
(1)
V
DD ANALOG
and V
DD IO
Supply Voltages −0.2V to 6.0V
Voltage at any Pin −0.2V to (V
DD IO
+ 0.2V)
Input Current at any Pin 5 mA
Storage Temperature −65°C to +175°C
Soldering Information
Infrared or Convection (20 sec.) 235°C
ESD Susceptibility
(2)
Human Body Model 2500 V
Machine Model 250 V
Charged Device Model 1000 V
(1) “Absolute Maximum Ratings” indicate limits beyond which damage to the device may occur, including inoperability and degradation of
device reliability and/or performance. Functional operation of the device and/or non-degradation at the Absolute Maximum Ratings or
other conditions beyond those indicated in the Operating Ratings is not implied. The Operating Ratings indicate conditions at which the
device is functional and the device should not be operated beyond such conditions.
(2) Human body model, 100 pF discharged through a 1.5 kΩ resistor. Machine model, 200 pF discharged directly into each pin. The
Charged Device Model (CDM) is a specified circuit characterizing an ESD event that occurs when a device acquires charge through
some triboelectric (frictional) or electrostatic induction processes and then abruptly touches a grounded object or surface.
Operating Ratings
Specified Temperature Range −40°C to +200°C
Analog Supply Voltage Range
+3.0V to +5.5V
V
DD ANALOG
Digital Supply Voltage Range
+3.0V to +5.5V
V
DD IO
Package Thermal Resistances
Package θ
JA
10-Lead CERPACK 175°C/W
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