Datasheet

LM7332
SNOSAV4A –APRIL 2008–REVISED MARCH 2013 www.ti.com
5V Electrical Characteristics
(1)
(continued)
Unless otherwise specified, all limits are ensured for T
A
= 25°C, V
+
= 5V, V
−
= 0V, V
CM
= 0.5V, V
O
= 2.5V, and R
L
> 1 MΩ to
2.5V. Boldface limits apply at the temperature extremes.
Symbol Parameter Condition Min
(2)
Typ
(3)
Max
(2)
Units
i
n
Input Referred Current Noise f = 2 kHz 1.35 pA/√HZ
THD+N Total Harmonic Distortion +Noise A
V
= +2, R
L
= 100 kΩ, f = 1 kHz, −84 dB
V
O
= 4 V
PP
CT Rej. Crosstalk Rejection f = 3 MHz, Driver R
L
= 10 kΩ 68 dB
±5V Electrical Characteristics
(1)
Unless otherwise specified, all limits are ensured for T
A
= 25°C, V
+
= +5V, V
−
= −5V, V
CM
= 0V, V
O
= 0V, and R
L
> 1 MΩ to
0V. Boldface limits apply at the temperature extremes.
Symbol Parameter Condition Min
(2)
Typ
(3)
Max
(2)
Units
V
OS
Input Offset Voltage V
CM
= −4.5V and V
CM
= 4.5V −4 ±1.6 +4
mV
−5 +5
TC V
OS
Input Offset Voltage V
CM
= −4.5V and V
CM
= 4.5V
(4)
±2 µV/°C
Temperature Drift
I
B
Input Bias Current See
(5)
−2.0 ±1.0 +2.0
µA
−2.5 +2.5
I
OS
Input Offset Current 20 250
nA
300
CMRR Common Mode Rejection Ratio −5V ≤ V
CM
≤ 3V 74 88
75
dB
−5V ≤ V
CM
≤ 5V 70 74
65
PSRR Power Supply Rejection Ration 5V ≤ V
+
≤ 30V, V
CM
= −4.5V 78 100
dB
74
CMVR Input Common Mode Voltage CMRR > 50 dB −5.3 −5.1
Range
−5
V
5.1 5.3
5.0
A
VOL
Large Signal Voltage Gain −4V ≤ V
O
≤ 4V 72 80
dB
R
L
= 10 kΩ to 0V
70
V
O
Output Swing R
L
= 10 kΩ to 0V 75 250
High V
ID
= 100 mV
300
R
L
= 2 kΩ to 0V 125 350
V
ID
= 100 mV 400
mV from
either rail
Output Swing R
L
= 10 kΩ to 0V 10 250
Low V
ID
= −100 mV
300
R
L
= 2 kΩ to 0V 30 350
V
ID
= −100 mV
400
(1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that T
J
= T
A
. No ensured specification of parametric performance is indicated in the electrical
tables under conditions of internal self-heating where T
J
> T
A
.
(2) All limits are ensured by testing or statistical analysis.
(3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped
production material.
(4) Offset voltage temperature drift determined by dividing the change in V
OS
at temperature extremes into the total temperature change.
(5) Positive current corresponds to current flowing in the device.
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