Datasheet

LM7321, LM7322
SNOSAW8D –MAY 2008–REVISED MARCH 2013 www.ti.com
2.7V Electrical Characteristics
(1)
(continued)
Unless otherwise specified, all limits ensured for T
A
= 25°C, V
+
= 2.7V, V
−
= 0V, V
CM
= 0.5V, V
OUT
= 1.35V, and R
L
> 1 MΩ to
1.35V. Boldface limits apply at the temperature extremes.
Min Typ Max
Symbol Parameter Condition Units
(2) (3) (2)
GBW Gain Bandwidth f = 50 kHz 16 MHz
e
n
Input Referred Voltage Noise Density f = 2 kHz 11.9
nV/
i
n
Input Referred Current Noise Density f = 2 kHz 0.5
pA/
V
+
= 1.9V, V
−
= −0.8V
THD+N Total Harmonic Distortion + Noise f = 1 kHz, R
L
= 100 kΩ, A
V
= +2 −77 dB
V
OUT
= 210 mV
PP
CT Rej. Crosstalk Rejection f = 100 kHz, Driver R
L
= 10 kΩ 60 dB
±5V Electrical Characteristics
(1)
Unless otherwise specified, all limited ensured for T
A
= 25°C, V
+
= 5V, V
−
= −5V, V
CM
= 0V, V
OUT
= 0V, and R
L
> 1 MΩ to 0V.
Boldface limits apply at the temperature extremes.
Min Typ Max
Symbol Parameter Condition Units
(2) (3) (2)
−5 ±0.7 +5
V
OS
Input Offset Voltage V
CM
= −4.5V and V
CM
= 4.5V mV
−6 +6
V
CM
= −4.5V and V
CM
= 4.5V
TC V
OS
Input Offset Voltage Temperature Drift ±2 µV/°C
(4)
V
CM
= −4.5V −2.0 −1.2
(5)
−2.5
I
B
Input Bias Current µA
V
CM
= 4.5V 0.45 1.0
(5)
1.5
20 200
I
OS
Input Offset Current V
CM
= −4.5V and V
CM
= 4.5V nA
300
80 100
−5V ≤ V
CM
≤ 3V
70
CMRR Common Mode Rejection Ratio dB
65 80
−5V ≤ V
CM
≤ 5V
62
78 104
PSRR Power Supply Rejection Ratio 2.7V ≤ V
S
≤ 30V, V
CM
= −4.5V dB
74
−5.3 −5.1
−5.0
CMVR Common Mode Voltage Range CMRR > 50 dB V
5.1 5.3
5.0
−4V ≤ V
O
≤ 4V 74 80
R
L
= 10 kΩ to 0V 70
A
VOL
Open Loop Voltage Gain dB
−4V ≤ V
O
≤ 4V 68 74
R
L
= 2 kΩ to 0V 65
(1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that T
J
= T
A
. No ensured specification of parametric performance is indicated in the electrical
tables under conditions of internal self-heating where T
J
> T
A
.
(2) All limits are ensured by testing or statistical analysis.
(3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped
production material.
(4) Offset voltage temperature drift determined by dividing the change in V
OS
at temperature extremes into the total temperature change.
(5) Positive current corresponds to current flowing into the device.
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