Datasheet
LM5114
www.ti.com
SNVS790E –JANUARY 2012–REVISED MARCH 2013
Absolute Maximum Ratings
(1)
VDD to VSS −0.3 to 14V
IN, INB to VSS −0.3 to 14V
N_OUT to VSS −0.3 to VDD +0.3V
P_OUT to VSS −0.3 to VDD +0.3V
Junction Temperature +150°C
Storage Temperature Range −55 to +150°C
ESD Rating HBM 2kV
(1) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for
which the device is intended to be functional, but does not guarantee specific performance limits. For guaranteed specifications and
conditions, see the Electrical Characteristics .
Recommended Operating Conditions
VDD +4.0 to 12.6V
Junction Temperature −40 to +125°C
Electrical Characteristics
Limits in standard type are for T
J
= 25°C only; limits in boldface type apply over the junction temperature (T
J
) range of -40°C
to +125°C. Minimum and Maximum limits are guaranteed through test, design, or statistical correlation. Typical values
represent the most likely parametric norm at T
J
= 25°C, and are provided for reference purposes only. Unless otherwise
specified, V
DD
= +12V
(1)
.
Symbol Parameter Conditions Min Typ Max Units
POWER SUPPLY
V
DD
VDD Operating Voltage 4.0 12.6 V
UVLO VDD Undervoltage Lockout VDD Rising 3.25 3.6 4.00 V
VDD Undervoltage Lockout Hysteresis 0.4 V
VDD Undervoltage lockout to Output delay
VDD Rising 300 ns
time
I
DD
VDD Quiescent Current IN = INB = VDD 0.95 1.9 mA
(1) Min and Max limits are 100% production tested at 25°C. Limits over the operating temperature range are guaranteed through correlation
using Statistical Quality Control (SQC) methods. Limits are used to calculate National’s Average Outgoing Quality Level (AOQL).
Copyright © 2012–2013, Texas Instruments Incorporated Submit Documentation Feedback 3
Product Folder Links: LM5114