Datasheet
LM5022
SNVS480G –JANUARY 2007–REVISED DECEMBER 2013
www.ti.com
Electrical Characteristics
(1)
Limits in standard type are for T
J
= 25°C only; limits in boldface type apply over the junction temperature (T
J
) range of -40°C
to +125°C. Minimum and Maximum limits are specified through test, design, or statistical correlation. Typical values represent
the most likely parametric norm at T
J
= 25°C, and are provided for reference purposes only. V
IN
= 24V and R
T
= 27.4 kΩ
unless otherwise indicated.
Parameter Test Conditions Min Typ Max Units
SYSTEM PARAMETERS
V
FB
FB Pin Voltage -40°C ≤ T
J
≤ 125°C 1.225 1.250 1.275 V
START-UP REGULATOR
VCC Regulation 9V ≤ V
IN
≤ 60V, I
CC
= 1 mA 6.6 7 7.4
VCC
(2)
V
6V ≤ V
IN
< 9V, VCC Pin Open 5
VCC Regulation
Circuit
OUT Pin Capacitance = 0 3.5 4
I
CC
Supply Current mA
VCC = 10V
I
CC-LIM
VCC Current Limit VCC = 0V, (
(3)
,
(2)
) 15 35 mA
I
CC
= 0 mA, f
SW
< 200 kHz 200
V
IN
- VCC Dropout Voltage Across Bypass Switch mV
6V ≤ V
IN
≤ 8.5V
V
BYP-HI
Bypass Switch Turn-off Threshold V
IN
increasing 8.7 V
V
BYP-HYS
Bypass Switch Threshold Hysteresis V
IN
Decreasing 260 mV
V
IN
= 6.0V 58
VCC Pin Output Impedance
Z
VCC
V
IN
= 8.0V 53 Ω
0 mA ≤ ICC ≤ 5 mA
V
IN
= 24.0V 1.6
VCC
-HI
VCC Pin UVLO Rising Threshold 5 V
VCC
-HYS
VCC Pin UVLO Falling Hysteresis 300 mV
I
VIN
Start-up Regulator Leakage V
IN
= 60V 150 500 µA
I
IN-SD
Shutdown Current V
UVLO
= 0V, VCC = Open Circuit 350 450 µA
ERROR AMPLIFIER
GBW Gain Bandwidth 4 MHz
A
DC
DC Gain 75 dB
V
FB
= 1.5V 5 17
I
COMP
COMP Pin Current Sink Capability mA
V
COMP
= 1V
UVLO
V
SD
Shutdown Threshold 1.22 1.25 1.28 V
Shutdown 16 20 24
I
SD-HYS
µA
Hysteresis Current Source
CURRENT LIMIT
CS steps from 0V to 0.6V 30
t
LIM-DLY
Delay from ILIM to Output ns
OUT transitions to 90% of VCC
V
CS
Current Limit Threshold Voltage 0.45 0.5 0.55 V
t
BLK
Leading Edge Blanking Time 65 ns
R
CS
CS Pin Sink Impedance Blanking active 40 75 Ω
SOFT-START
I
SS
Soft-start Current Source 7 10 13 µA
V
SS-OFF
Soft-start to COMP Offset 0.35 0.55 0.75 V
(1) Min and Max limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlation
using Statistical Quality Control (SQC) methods. Limits are used to calculate Average Outgoing Quality Level (AOQL).
(2) VCC provides bias for the internal gate drive and control circuits.
(3) Device thermal limitations may limit usable range.
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