Datasheet

LM5015
www.ti.com SNVS538C –NOVEMBER 2007–REVISED APRIL 2013
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
Absolute Maximum Ratings
(1)(2)
V
IN
to AGND 76V
BST to AGND 90V
PVIN to HO, LO, PGND 76V
HO to PGND (Steady State) -3V to 76V
LO to PGND (Steady State) -0.3V to 76V
BST to VCC 76V
BST to HO 14V
V
CC
, EN to AGND 14V
COMP, FB, RT, SS to AGND -0.3V to 7V
PGND to AGND -0.3V to +0.3V
CFB Sink Current 10 mA
Maximum Junction Temperature 150°C
Storage Temperature −65°C to + 150°C
ESD Rating
Human Body Model
(3)
2 kV
(1) Absolute Maximum Ratings are limits beyond which damage to the device may occur. Operating Ratings are conditions under which
operation of the device is intended to be functional. For ensured specifications and test conditions, see the Electrical Characteristics.
(2) If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/Distributors for availability and
specifications.
(3) The human body model is a 100pF capacitor discharged through a 1.5 kΩ resistor into each pin. Test Method is per JESD-22-A114.
Operating Ratings
V
IN
4.25V to 75V
Operation Junction Temperature −40°C to + 125°C
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