Datasheet
LM48556
www.ti.com
SNAS452B –JUNE 2008–REVISED MAY 2013
Electrical Characteristics V
DD
= 3.6V
(1)
(continued)
The following specifications apply for V
DD
= 3.6V, A
V-BTL
= 20dB (R
F
= 200kΩ, R
IN
= 20kΩ), Z
L
= 15Ω+1μF, unless otherwise
specified. Limits apply for T
A
= 25°C.
LM48556
Units
Symbol Parameter Conditions
(Limits)
Typical
(2)
Limit
(3)
CMRR Common Mode Rejection Ratio Input Referred 70 60 dB (min)
V
LH
Logic High Threshold Voltage 1.2 V (min)
V
LL
Logic Low Threshold Voltage 0.45 V (max)
Electrical Characteristics V
DD
= 4.5V
(1)
The following specifications apply for V
DD
= 4.5V, A
V-BTL
= 20dB (R
F
= 200kΩ, R
IN
= 20kΩ), Z
L
= 15Ω+1μF, unless otherwise
specified. Limits apply for T
A
= 25°C.
LM48556
Units
Symbol Parameter Conditions
(Limits)
Typical
(2)
Limit
(3)
I
DD
Quiescent Power Supply Current V
IN
= 0V 6.5 10 mA (max)
I
SD
Shutdown Current V
SD
= GND (Note 8) 0.1 1 µA (max)
V
OS
Output Offset Voltage C
IN
= 0.47μF, A
V
= 1V/V (0dB) 0.6 4 mV (max)
T
WU
Wake-up Time 0.5 ms (max)
THD+N = 1% (max); f = 1kHz 17.5 V
PP
V
OUT
Output Voltage Swing
THD+N = 1% (max); f = 10kHz 14.6 14 V
PP
(min)
V
OUT
= 14V
PP
, f = 1kHz
THD+N Total Harmonic Distortion + Noise A
V
= 0dB 0.005 %
A
V
= 20dB 0.03 %
A-weighted filter, V
IN
= 0V
ε
OS
Output Noise 8 μV
Input referred
PSRR Power Supply Rejection Ratio V
RIPPLE
= 200mV
PP
, f = 217Hz, 80 60 dB (min)
CMRR Common Mode Rejection Ratio Input Referred 70 60 dB (min)
V
LH
Logic High Threshold Voltage 1.2 V (min)
V
LL
Logic Low Threshold Voltage 0.45 V (max)
(1) The Electrical Characteristics tables list ensured specifications under the listed Recommended Operating Conditions except as
otherwise modified or specified by the Electrical Characteristics Conditions and/or Notes. Typical specifications are estimations only and
are not ensured.
(2) Typical values represent most likely parametric norms at T
A
= +25ºC, and at the Recommended Operation Conditions at the time of
product characterization and are not ensured.
(3) Datasheet min/max specification limits are specified by test or statistical analysis.
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