Datasheet

LM4853
www.ti.com
SNAS155E JANUARY 2002REVISED MAY 2013
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
Absolute Maximum Ratings
(1)(2)
Supply Voltage 6.0V
Storage Temperature 65°C to +150°C
ESD Susceptibility
(3)
3.5kV
ESD Machine model
(4)
250V
Junction Temperature (T
J
) 150°C
Solder Information Small Outline Package Vapor Phase (60 sec.) 215°C
Infrared (15 sec.) 220°C
θ
JA
(typ)—DGS 194°C/W
θ
JC
(typ)—DGS 52°C/W
Thermal Resistance
θ
JA
(typ)—NHE0014A
(5)
56°C/W
θ
JC
(typ)—NHE0014A 4.3°C/W
(1) Absolute Maximum Rating indicate limits beyond which damage to the device may occur.
(2) If Military/Aerospace specified devices are required, please contact the TI Sales Office/ Distributors for availability and specifications.
(3) Human body model, 100pF discharged through a 1.5kΩ resistor.
(4) Machine Model ESD test is covered by specification EIAJ IC-121-1981. A 200pF cap is charged to the specified voltage, then
discharged directly into the IC with no external series resistor (resistance of discharge path must be under 50).
(5) The given θ
JA
is for an LM4853LD with the Exposed-DAP soldered to an exposed 1in
2
area of 1oz printed circuit board copper.
Operating Ratings
(1)
Temperature Range 40°C to 85°C
Supply Voltage V
DD
2.4V V
DD
5.5V
(1) Absolute Maximum Rating indicate limits beyond which damage to the device may occur.
Electrical Characteristics
(1)(2)
The following specifications apply for V
DD
= 5.0V, T
A
= 25°C unless otherwise specified.
Symbol Parameter Conditions LM4853 Units
(Limits)
Typical
(3)
Limit
(4)(5)
V
DD
Supply Voltage 2.4 V (min)
5.5 V (max)
I
DD
Supply Current BTL Mode; V
IN
= 0V; I
O
= 0A 2.4 7.0 mA
SE Mode; V
IN
= 0V; I
O
= 0A 2.4 7.0 mA
I
SD
Shutdown Current SD Mode; V
SHUTDOWN
= V
DD
18 µA
V
OS
Output Offset Voltage BTL Mode; A
V
= 2 5.0 40 mV
BTL OUT+ to BTL OUT
(1) Absolute Maximum Rating indicate limits beyond which damage to the device may occur.
(2) All voltages are measured with respect to the ground pin, unless otherwise specified.
(3) Typical specifications are specified at +25°C and represent the most likely parametric norm.
(4) Datasheet min/max specification limits are ensured by design, test, or statistical analysis.
(5) Limits are specified to TI's AOQL ( Average Outgoing Quality Level ).
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