Datasheet

LM48310
SNAS430D NOVEMBER 2007REVISED MAY 2013
www.ti.com
ABSOLUTE MAXIMUM RATINGS
(1)(2)(3)
Supply Voltage 6.0V
Storage Temperature 65°C to +150°C
Input Voltage 0.3V to V
DD
+0.3V
Power Dissipation
(4)
Internally Limited
ESD Rating
(5)
2000V
ESD Rating
(6)
200V
Junction Temperature 150°C
Thermal Resistance θ
JC
8.2°C/W
θ
JA
49.2°C/W
(1) “Absolute Maximum Ratings” indicate limits beyond which damage to the device may occur, including inoperability and degradation of
device reliability and/or performance. Functional operation of the device and/or non-degradation at the Absolute Maximum Ratings or
other conditions beyond those indicated in the Recommended Operating Conditions is not implied. The Recommended Operating
Conditionsindicate conditions at which the device is functional and the device should not be operated beyond such conditions. All
voltages are measured with respect to the ground pin, unless otherwise specified.
(2) The Electrical Characteristics tables list ensured specifications under the listed Recommended Operating Conditions except as
otherwise modified or specified by the Electrical Characteristics Conditions and/or Notes. Typical specifications are estimations only and
are not ensured.
(3) If Military/Aerospace specified devices are required, please contact the TI Sales Office/ Distributors for availability and specifications.
(4) The maximum power dissipation must be derated at elevated temperatures and is dictated by T
JMAX
, θ
JA
, and the ambient temperature,
T
A
. The maximum allowable power dissipation is P
DMAX
= (T
JMAX
- T
A
) / θ
JA
or the number given in Absolute Maximum Ratings,
whichever is lower.
(5) Human body model, applicable std. JESD22-A114C.
(6) Machine model, applicable std. JESD22-A115-A.
OPERATING RATINGS
(1)(2)
Temperature Range T
MIN
T
A
T
MAX
40°C T
A
+85°C
Supply Voltage 2.4V V
DD
5.5V
(1) “Absolute Maximum Ratings” indicate limits beyond which damage to the device may occur, including inoperability and degradation of
device reliability and/or performance. Functional operation of the device and/or non-degradation at the Absolute Maximum Ratings or
other conditions beyond those indicated in the Recommended Operating Conditions is not implied. The Recommended Operating
Conditionsindicate conditions at which the device is functional and the device should not be operated beyond such conditions. All
voltages are measured with respect to the ground pin, unless otherwise specified.
(2) The Electrical Characteristics tables list ensured specifications under the listed Recommended Operating Conditions except as
otherwise modified or specified by the Electrical Characteristics Conditions and/or Notes. Typical specifications are estimations only and
are not ensured.
ELECTRICAL CHARACTERISTICS V
DD
= PV
DD
= 5V
(1)(2)
The following specifications apply for A
V
= 12dB, (R
L
= 8, SYNC_IN = V
DD
(Spread Spectrum mode), f = 1kHz, unless
otherwise specified. Limits apply for T
A
= 25°C.
LM48310
Units
Symbol Parameter Conditions
(Limits)
Typical
(3)
Limit
(4)(2)
V
OS
Differential Output Offset Voltage V
IN
= 0 1 3 mV (max)
V
IN
= 0, R
L
=
2.7 3.9 mA (max)
V
DD
= 3.6V
I
DD
Quiescent Power Supply Current
V
IN
= 0, R
L
=
3.2 4.4 mA (max)
V
DD
= 5V
V
IN
= 0, V
DD
= 3.6V 2.7 mA
I
DD
Quiescent Power Supply Current
V
IN
= 0, V
DD
= 5V 3.2 mA
I
SD
Shutdown Current V
SD
= GND 0.01 1.0 μA
V
IH
Logic Input High Voltage SD input, V
DD
= 3.6V 1.4 V (min)
(1) The Electrical Characteristics tables list ensured specifications under the listed Recommended Operating Conditions except as
otherwise modified or specified by the Electrical Characteristics Conditions and/or Notes. Typical specifications are estimations only and
are not ensured.
(2) R
L
is a resistive load in series with two inductors to simulate an actual speaker load. For R
L
= 8, the load is 15µH + 8, +15µH. For R
L
= 4, the load is 15µH + 4 + 15µH.
(3) Typical values represent most likely parametric norms at T
A
= +25°C, and at the Recommended Operation Conditions at the time of
product characterization and are not specified.
(4) Datasheet min/max specification limits are specified by test or statistical analysis.
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