Datasheet

LM4811
SNAS119D DECEMBER 2000REVISED APRIL 2013
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Electrical Characteristics
(1)(2)
(continued)
The following specifications apply for V
DD
= 5V unless otherwise specified, limits apply to T
A
= 25°C.
LM4811
Units
Parameter Test Conditions
(Limits)
Typ
(3)
Limit
(4)
V
IL
(CLOCK, UP/DN, SHUTDOWN) 0.4 V (max)
Input Voltage Low
Digital Volume Range Input referred minimum gain 33 dB
Input referred maximum gain +12 dB
Digital Volume Stepsize All 16 discrete steps 3.0 dB
Stepsize Error All 16 discrete steps ±0.3 dB
ChanneltoChannel Volume All gain settings from 0.15 dB
Tracking Error 33dB to +12dB
Shutdown Attenuation Shutdown mode active 100 dB
Electrical Characteristics
(1)(2)
The following specifications apply for V
DD
= 3.3V unless otherwise specified, limits apply to T
A
= 25°C.
LM4811
Units
Parameter Test Conditions
(Limits)
Typ
(3)
Limit
(4)
I
DD
Supply Current V
IN
= 0V, I
O
= 0A 1.1 mA
I
SD
Shutdown Current V
IN
= 0V 0.3 µA
V
OS
Output Offset Voltage V
IN
= 0V 4.0 mV
P
o
Output Power 0.1% THD+N; f = 1kHz
R
L
= 16 40 mW
R
L
= 32 28 mW
THD+N Total Harmonic Distortion P
O
= 25mW, R
L
= 32 0.5 %
f = 20Hz to 20kHz
PSRR Power Supply Rejection Ratio C
B
= 1.0µF, V
RIPPLE
= 100mV
PP
60 dB
f = 217Hz
V
IH
(CLOCK, UP/DN, SHUTDOWN) 1.4 V (min)
Input Voltage High
V
IL
(CLOCK, UP/DN, SHUTDOWN) 0.4 V (max)
Input Voltage Low
Digital Volume Range Input referred minimum gain 33 dB
Input referred maximum gain +12 dB
Digital Volume Stepsize All 16 discrete steps 3.0 dB
Stepsize Error All 16 discrete steps ±0.3 dB
ChanneltoChannel Volume All gain settings from 0.15 dB
Tracking Error 33dB to +12dB
Shutdown Attenuation Shutdown mode active 100 dB
(1) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur.
(2) All voltages are measured with respect to the ground pin, unless otherwise specified.
(3) Typical specifications are specified at +25°C and represent the most likely parametric norm.
(4) Tested limits are ensured to TI's AOQL (Average Outgoing Quality Level). Datasheet min/max specification limits are ensured by design,
test, or statistical analysis.
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