Datasheet
LM4510
SNVS533C –SEPTEMBER 2007–REVISED MAY 2013
www.ti.com
Electrical Characteristics
(1)(2)
Limits in standard type face are for T
J
= 25°C only. Limits in boldface type apply over the full operating junction temperature
range ( −40°C ≤ T
J
≤+125°C). Unless otherwise stated the following conditions apply: VIN = 3.6V, EN = 3.6V.
Parameter Test Conditions Min
(1)
Typ
(2)
Max
(1)
Units
V
FB
FB Pin Voltage 2.7V ≤ VIN ≤ 5.5V 1.24 1.265 1.29 V
I
FB
FB Pin Bias Current
(3)
0.050 1.5 µA
NMOS Switch R
DS(on)
I
SW
= 0.3A 0.45 1.1
R
DS(on)
Ω
PMOS Switch R
DS(on)
I
SW
= 0.3A, VOUT = 10V 0.9 1.1
I
CL
NMOS Switch Current Limit 1.0 1.2 1.8 A
Device Switching EN = 3.6V, FB = COMP 1.7 2.5 mA
I
Q
Non-switching Current EN = 3.6V, FB > 1.29V 0.8 2.0 mA
Shutdown Current EN = 0V 0.002 0.050 µA
I
L
SW Leakage Current
(3)
SW = 20V 0.01 0.150 µA
I
VOUT
VOUT Bias Current
(3)
VOUT = 20V 50 90 150 µA
PMOS Switch Leakage SW = 0V, VOUT = 20V
I
VL
0.001 0.100 µA
Current
f
SW
Switching Frequency 0.85 1.0 1.2 MHz
D
MAX
Maximum Duty Cycle FB = 0V 88 94 %
D
MIN
Minimum Duty Cycle 15 20 %
Error Amplifier
Gm 70 130 200 µmho
Transconductance
Device Enable HIGH 1.2 0.81
EN
V
Threshold
Device Shutdown LOW 0.78 0.4
I
EN
EN Pin Bias Current 0 < EN < 3.6V 3.2 8.0 µA
ON Threshold 18.0 19.7 20.7 V
FB Fault
Feedback Fault Protection
Protection
OFF Threshold 17.0 18.7 20.0
ON Threshold 2.5 2.65
UVLO Input Undervoltage Lockout V
OFF Threshold 2.1 2.35
I
SS
Soft-Start Pin Current
(4)
9 11.3 15 µA
(1) All limits specified at room temperature (standard typeface) and at temperature extremes (bold typeface). All room temperature limits are
production tested, specified through statistical analysis or by design. All limits at temperature extremes are specified via correlation
using standard Statistical Quality Control (SQC) methods. All limits are used to calculate Average Outgoing Quality Level (AOQL).
(2) Typical numbers are at 25°C and represent the most likely norm.
(3) Current flows into the pin.
(4) Current flows out of the pin.
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