Datasheet

LM4125
www.ti.com
SNVS238A MAY 2004REVISED APRIL 2013
Electrical Characteristics LM4125-2.048V and 2.5V
Unless otherwise specified V
IN
= 3.3V, I
LOAD
= 0, C
OUT
= 0.01µF, T
A
= T
j
= 25°C. Limits with standard typeface are for T
j
=
25°C, and limits in boldface type apply over the 40°C T
A
+85°C temperature range.
Min Typ Max
Symbol Parameter Conditions Units
(1) (2) (1)
Output Voltage Initial Accuracy
LM4125A-2.048 ±0.2 %
LM4125A-2.500
V
OUT
LM4125-2.048
±0.5 %
LM4125-2.500
TCV
OUT
/°C Temperature Coefficient 40°C T
A
+125°C 14 50 ppm/°c
ΔV
OUT
/ΔV
IN
Line Regulation 3.3V V
IN
6V 0.0007 0.008
%/V
0.01
0 mA I
LOAD
1 mA 0.03 0.08
0.17
1 mA I
LOAD
5 mA 0.01 0.04
ΔV
OUT
/ΔI
LOAD
Load Regulation %/mA
0.1
1 mA I
LOAD
0 mA 0.04 0.12
5 mA I
LOAD
1 mA 0.01
I
LOAD
= 0 mA 45 65
100
I
LOAD
= +1 mA 120 150
V
IN
V
OUT
Dropout Voltage
(3)
mV
200
I
LOAD
= +5 mA 180 210
300
V
N
Output Noise Voltage
(4)
0.1 Hz to 10 Hz 20 µV
PP
10 Hz to 10 kHz 36 µV
PP
I
S
Supply Current 160 257 µA
290
V
IN
= 3.3V, V
OUT
= 0 15
6 30
I
SC
Short Circuit Current mA
V
IN
= 6V, V
OUT
= 0 17
6 30
Hyst Thermal Hysteresis
(5)
40°C T
A
125°C 0.5 mV/V
ΔV
OUT
Long Term Stability
(6)
1000 hrs. @ 25°C 100 ppm
(1) Limits are 100% production tested at 25°C. Limits over the operating temperature range are ensured through correlation using Statistical
Quality Control (SQC) methods. The limits are used to calculate Outgoing Quality Level (AOQL).
(2) Typical numbers are at 25°C and represent the most likely parametric norm.
(3) Dropout voltage is the differential voltage between V
OUT
and V
IN
at which V
OUT
changes 1% from V
OUT
at V
IN
= 3.3V for 2.0V, 2.5V
and 5V for 4.1V. A parasitic diode exists between input and output pins; it will conduct if V
OUT
is pulled to a higher voltage than V
IN
.
(4) Output noise voltage is proportional to V
OUT
. V
N
for other voltage option is calculated using (V
N(1.8V)
/1.8) * V
OUT
. V
N
(2.5V) =
(36µV
PP
/1.8) * 2.5 = 46µV
PP
.
(5) Thermal hysteresis is defined as the change in +25°C output voltage before and after exposing the device to temperature extremes.
(6) Long term stability is change in V
REF
at 25°C measured continuously during 1000 hrs.
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