Datasheet

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Recommended Operating Conditions
Electrical Characteristics
LM237 , LM337
3-TERMINAL ADJUSTABLE REGULATORS
SLVS047K NOVEMBER 1981 REVISED NOVEMBER 2007
MIN MAX UNIT
|V
I
V
O
| 40 V, P 15 W 10 1500
I
O
Output current mA
|V
I
V
O
| 10 V, P 15 W 6 1500
LM237 25 150
T
J
Operating virtual junction temperature ° C
LM337 0 125
over recommended ranges of operating virtual junction temperature (unless otherwise noted)
LM237 LM337
PARAMETER TEST CONDITIONS
(1)
UNIT
MIN TYP MAX MIN TYP MAX
T
J
= 25 ° C 0.01 0.02 0.01 0.04
Input regulation
(2)
V
I
V
O
= 3 V to 40 V %/V
T
J
= MIN to MAX 0.02 0.05 0.02 0.07
V
O
= 10 V, f = 120 Hz 60 60
Ripple rejection dB
V
O
= 10 V, f = 120 Hz, C
ADJ
= 10 µ F 66 77 66 77
|V
O
| 5 V 25 50 mV
I
O
= 10 mA to 1.5 A,
T
J
= 25 ° C
|V
O
| 5 V 0.3 0.5 0.3 1 %
Output regulation
|V
O
| 5 V 50 70 mV
I
O
= 10 mA to 1.5 A
|V
O
| 5 V 1 1.5 %
Output-voltage change with
T
J
= MIN to MAX 0.6 0.6 %
temperature
Output-voltage
After 1000 h at T
J
= MAX and V
I
V
O
= 40 V 0.3 1 0.3 1 %
long-term drift
Output noise voltage f = 10 Hz to 10 kHz, T
J
= 25 ° C 0.003 0.003 %
|V
I
V
O
| 40 V 2.5 5 2.5 10
Minimum output current to
mA
maintain regulation
|V
I
V
O
| 10 V 1.2 3 1.5 6
|V
I
V
O
| 15 V 1.5 2.2 1.5 2.2
Peak output current A
|V
I
V
O
| 40 V, T
J
= 25 ° C 0.24 0.4 0.15 0.4
ADJUSTMENT current 65 100 65 100 µ A
Change in ADJUSTMENT V
I
V
O
= 2.5 V to 40 V, I
O
= 10 mA to MAX,
2 5 2 5 µ A
current T
J
= 25 ° C
Reference voltage V
I
V
O
= 3 V to 40 V, T
J
= 25 ° C 1.225 1.25 1.275 1.213 1.25 1.287
(OUTPUT to I
O
= 10 mA to 1.5 A, V
T
J
= MIN to MAX 1.2 1.25 1.3 1.2 1.25 1.3
ADJUSTMENT) P rated dissipation
Thermal regulation Initial T
J
= 25 ° C, 10-ms pulse 0.002 0.02 0.003 0.04 %/W
(1) Unless otherwise noted, the following test conditions apply: |V
I
V
O
| = 5 V and I
O
= 0.5 A. For conditions shown as MIN or MAX, use
the appropriate value specified under recommended operating conditions. All characteristics are measured with a 0.1- µ F capacitor
across the input and a 1- µ F capacitor across the output. Pulse-testing techniques are used to maintain the junction temperature as close
to the ambient temperature as possible. Thermal effects must be taken into account separately.
(2) Input regulation is expressed here as the percentage change in output voltage per 1-V change at the input.
Copyright © 1981 2007, Texas Instruments Incorporated Submit Documentation Feedback 3
Product Folder Link(s): LM237 LM337