Datasheet

LM2936
www.ti.com
SNOSC48N JUNE 2000REVISED MARCH 2013
Operating Ratings
Operating Temperature Range 40°C to +125°C
Maximum Operating Input Voltage - LM2936 +40V
Maximum Operating Input Voltage - LM2936HV only +60V
Maximum Shutdown Pin Voltage - LM2936BM only 0V to 40V
TO-92 (LP0003A) θ
JA
195°C/W
VSSOP-8 (DGK0008A) θ
JA
200°C/W
SOIC-8 (D0008A) θ
JA
140°C/W
SOIC-8 (D0008A) θ
JC
45°C/W
PFM (NDP0003B) θ
JA
136°C/W
PFM (NDP0003B) θ
JC
6°C/W
SOT-223 (DCY0004A) θ
JA
149°C/W
SOT-223 (DCY0004A) θ
JC
36°C/W
Electrical Characteristics for LM2936–3.0
V
IN
= 14V, I
O
= 10 mA, T
J
= 25°C, unless otherwise specified. Boldface limits apply over entire operating temperature range
Min Typical Max
Parameter Conditions Units
(1) (2) (1)
LM2936HV–3.0 Only
Output Voltage 5.5V V
IN
48V,
2.910 3.000 3.090 V
100 µA I
O
50 mA
(3)
Line Regulation 6V V
IN
60V, I
O
= 1mA 10 30 mV
All LM2936–3.0
2.940 3.000 3.060
Output Voltage V
4.0V V
IN
26V, 2.910 3.000 3.090
100 µA I
O
50 mA
(3)
Quiescent Current I
O
= 100 μA, 8V V
IN
24V 15 20 μA
I
O
= 10 mA, 8V V
IN
24V 0.20 0.50 mA
I
O
= 50 mA, 8V V
IN
24V 1.5 2.5 mA
Line Regulation 9V V
IN
16V 5 10
mV
6V V
IN
40V, I
O
= 1 mA 10 30
Load Regulation 100 μA I
O
5 mA 10 30
mV
5 mA I
O
50 mA 10 30
Dropout Voltage I
O
= 100 μA 0.05 0.10 V
I
O
= 50 mA 0.20 0.40 V
Short Circuit Current V
O
= 0V 65 120 250 mA
Output Impedance I
O
= 30 mAdc and 10 mArms, 450
mΩ
f
= 1000 Hz
Output Noise Voltage 10 Hz–100 kHz 500 μV
Long Term Stability 20 mV/1000 Hr
Ripple Rejection V
ripple
= 1V
rms
,
fripple
= 120 Hz 40 60 dB
Reverse Polarity R
L
= 500Ω, T = 1 ms 50
80 V
Transient Input Voltage
Output Voltage with V
IN
= 15V, R
L
= 500Ω
0.00 0.30 V
Reverse Polarity Input
Maximum Line Transient R
L
= 500Ω, V
O
3.30V, T = 40ms 60 V
Output Bypass C
OUT
= 22µF
0.3 8 Ω
Capacitance (C
OUT
) ESR 0.1mA I
OUT
50mA
Shutdown Input LM2936BM–3.0 Only
(1) Datasheet min/max specification limits are ensured by design, test, or statistical analysis.
(2) Typicals are at 25°C (unless otherwise specified) and represent the most likely parametric norm.
(3) To ensure constant junction temperature, pulse testing is used.
Copyright © 2000–2013, Texas Instruments Incorporated Submit Documentation Feedback 3
Product Folder Links: LM2936