Datasheet
LM27222
SNVS306B –SEPTEMBER 2004–REVISED MARCH 2013
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Electrical Characteristics
(1)
VCC = CB = 5V, SW = GND = 0V, unless otherwise specified. Typicals and limits appearing in plain type apply for T
A
= T
J
=
+25°C. Limits appearing in boldface type apply over the entire operating temperature range (-40°C ≤ T
J
≤ 125°C).
Symbol Parameter Conditions Min Typ Max Units
POWER SUPPLY
I
q_op
Operating Quiescent Current IN = 0V, LEN = 0V 5 15 µA
30
IN = 0V, LEN = 5V 500 540 650 µA
825
HIGH-SIDE DRIVER
Peak Pull-up Current 3 A
R
H-pu
Pull-up Rds_on I
CB
= I
HG
= 0.3A 0.9 2.5 Ω
Peak Pull-down Current 4.5 A
R
H-pd
Pull-down Rds_on I
SW
= I
HG
= 0.3A 0.4 1.5 Ω
t
4
Rise Time Timing Diagram, C
LOAD
= 3.3nF 17 ns
t
6
Fall Time Timing Diagram, C
LOAD
= 3.3nF 12 ns
t
3
Pull-up Dead Time Timing Diagram 9.5 ns
t
5
Pull-down Delay Timing Diagram 16.5 ns
t
on_min
Minimum Positive Output 30 ns
Pulse Width
LOW-SIDE DRIVER
Peak Pull-up Current 3.2 A
R
L-pu
Pull-up Rds_on I
VCC
= I
LG
= 0.3A 0.9 2.5 Ω
Peak Pull-down Current 4.5 A
R
L-pd
Pull-down Rds_on I
GND
= I
LG
= 0.3A 0.4 1.5 Ω
t
8
Rise Time Timing Diagram, C
LOAD
= 3.3nF 17 ns
t
2
Fall Time Timing Diagram, C
LOAD
= 3.3nF 14 ns
t
7
Pull-up Dead Time Timing Diagram 11.5 ns
t
1
Pull-down Delay Timing Diagram 7.7 ns
PULL-DOWN RESISTANCES
HG-SW Pull-down Resistance 10k Ω
LG-GND Pull-down 10k Ω
Resistance
LEN-GND Pull-down 150K Ω
Resistance
IN-GND Pull-down Resistance 150K Ω
LEAKAGE CURRENTS
I
leak_IN
IN pin Leakage Current IN = 0V, Source Current 50 nA
IN = 5V, Sink Current 33 µA
I
leak_LEN
LEN pin Leakage Current LEN = 0V, Source Current 200 nA
LEN = 5V, Sink Current 33 µA
LOGIC
V
IH_LEN
LEN Low to High Threshold Low to High Transition 65 % of V
CC
V
IL_LEN
LEN High to Low Threshold High to Low Transition 30 % of V
CC
V
IH_IN
IN Low to High Threshold Low to High Transition 65 % of V
CC
V
IL_IN
IN High to Low Threshold High to Low Transition 30 % of V
CC
Threshold Hysteresis 0.7 V
(1) Min and Max limits are 100% production tested at 25°C. Limits over the operating temperature range are ensured through correlation
using Statistical Quality Control (SQC) methods. Limits are used to calculate Average Outgoing Quality Level (AOQL).
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