Datasheet

LM2717-ADJ
www.ti.com SNVS407C –DECEMBER 2005–REVISED MARCH 2013
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
Absolute Maximum Ratings
(1)
V
IN
−0.3V to 22V
SW1 Voltage −0.3V to 22V
SW2 Voltage −0.3V to 22V
FB1, FB2 Voltages −0.3V to 7V
CB1, CB2 Voltages −0.3V to V
IN
+7V
(V
IN
=V
SW
)
V
C1
Voltage 1.75V ≤ V
C1
≤ 2.25V
V
C2
Voltage 0.965V ≤ V
C2
≤ 1.565V
SHDN1 Voltage −0.3V to 7.5V
SHDN2 Voltage −0.3V to 7.5V
SS1 Voltage −0.3V to 2.1V
SS2 Voltage −0.3V to 2.1V
FSLCT Voltage AGND to 5V
Maximum Junction Temperature 150°C
Power Dissipation
(2)
Internally Limited
Lead Temperature 300°C
Vapor Phase (60 sec.) 215°C
Infrared (15 sec.) 220°C
ESD Susceptibility
(3)
Human Body Model 2kV
(1) Absolute maximum ratings are limits beyond which damage to the device may occur. Operating Ratings are conditions for which the
device is intended to be functional, but device parameter specifications may not be ensured. For ensured specifications and test
conditions, see the Electrical Characteristics table.
(2) The maximum allowable power dissipation is a function of the maximum junction temperature, T
J
(MAX), the junction-to-ambient thermal
resistance, θ
JA
, and the ambient temperature, T
A
. See the Electrical Characteristics table for the thermal resistance. The maximum
allowable power dissipation at any ambient temperature is calculated using: P
D
(MAX) = (T
J(MAX)
− T
A
)/θ
JA
. Exceeding the maximum
allowable power dissipation will cause excessive die temperature, and the regulator will go into thermal shutdown.
(3) The human body model is a 100 pF capacitor discharged through a 1.5kΩ resistor into each pin.
Operating Conditions
Operating Junction Temperature Range
(1)
−40°C to +125°C
Storage Temperature −65°C to +150°C
Supply Voltage 4V to 20V
SW1 Voltage 20V
SW2 Voltage 20V
Switching Frequency 300kHz to 600kHz
(1) All limits specified at room temperature (standard typeface) and at temperature extremes (bold typeface). All room temperature limits are
100% tested or specified through statistical analysis. All limits at temperature extremes are specified via correlation using standard
Statistical Quality Control (SQC) methods. All limits are used to calculate Average Outgoing Quality Level (AOQL).
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