Datasheet

LM2599
www.ti.com SNVS123C –APRIL 1998–REVISED APRIL 2013
Absolute Maximum Ratings
(1)(2)
Maximum Supply Voltage (V
IN
) 45V
SD /SS Pin Input Voltage
(3)
6V
Delay Pin Voltage
(3)
1.5V
Flag Pin Voltage −0.3 ≤ V ≤45V
Feedback Pin Voltage −0.3 ≤ V ≤+25V
Output Voltage to Ground
(Steady State) −1V
Power Dissipation Internally limited
Storage Temperature Range −65°C to +150°C
ESD Susceptibility
Human Body Model
(4)
2 kV
Lead Temperature
KTW Package
Vapor Phase (60 sec.) +215°C
Infrared (10 sec.) +245°C
NDZ Package (Soldering, 10 sec.) +260°C
Maximum Junction Temperature +150°C
(1) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for
which the device is intended to be functional, but do not ensure specific performance limits. For ensured specifications and test
conditions, see the Electrical Characteristics section.
(2) If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/ Distributors for availability and
specifications.
(3) Voltage internally clamped. If clamp voltage is exceeded, limit current to a maximum of 1 mA.
(4) The human body model is a 100 pF capacitor discharged through a 1.5k resistor into each pin.
Operating Conditions
Temperature Range −40°C ≤ T
J
≤ +125°C
Supply Voltage 4.5V to 40V
LM2599-3.3 Electrical Characteristics
Specifications with standard type face are for T
J
= 25°C, and those with boldface type apply over full Operating
Temperature Range.
Symbol Parameter Conditions LM2599-3.3 Units
(Limits)
Typ Limit
(1) (2)
SYSTEM PARAMETERS
(3)
Test Circuit Figure 24
V
OUT
Output Voltage 4.75V ≤ V
IN
≤ 40V, 0.2A ≤ I
LOAD
≤ 3A 3.3 V
3.168/3.135 V(min)
3.432/3.465 V(max)
η Efficiency V
IN
= 12V, I
LOAD
= 3A 73 %
(1) Typical numbers are at 25°C and represent the most likely norm.
(2) All limits ensured at room temperature (standard type face) and at temperature extremes (bold type face). All room temperature limits
are 100% production tested. All limits at temperature extremes are specified via correlation using standard Statistical Quality Control
(SQC) methods. All limits are used to calculate Average Outgoing Quality Level (AOQL).
(3) External components such as the catch diode, inductor, input and output capacitors can affect switching regulator system performance.
When the LM2599 is used as shown in the Figure 24 test circuit, system performance will be as shown in system parameters of
Electrical Characteristics section.
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