Datasheet

TMS570LS1224
SPNS190B OCTOBER 2012REVISED FEBRUARY 2015
www.ti.com
8.2 Documentation Support
8.2.1 Related Documentation from Texas Instruments
The following documents describe the TMS570LS11x/12x microcontroller..
SPNU515 TMS570LS12x/11x 16/32-Bit RISC Flash Microcontroller Technical Reference Manual details the
integration, the environment, the functional description, and the programming models for each
peripheral and subsystem in the device.
SPNZ199 TMS570LS12x/11x Microcontroller, Silicon Revision B, Silicon Errata describes the usage notes
and known exceptions to the functional specifications for the device silicon revision B.
SPNZ218 TMS570LS12x/11x Microcontroller, Silicon Revision C, Silicon Errata describes the usage notes
and known exceptions to the functional specifications for the device silicon revision C.
8.2.2 Community Resources
The following links connect to TI community resources. Linked contents are provided "AS IS" by the
respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views;
see TI's Terms of Use.
TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration among
engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help solve
problems with fellow engineers.
TI Embedded Processors Wiki Texas Instruments Embedded Processors Wiki. Established to help developers
get started with Embedded Processors from Texas Instruments and to foster innovation and growth of
general knowledge about the hardware and software surrounding these devices.
8.3 Trademarks
E2E is a trademark of Texas Instruments.
CoreSight is a trademark of ARM Limited.
ARM, Cortex are registered trademarks of ARM Limited (or its subsidiaries) in the EU and/or elsewhere.
All rights reserved.
All other trademarks are the property of their respective owners.
8.4 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
8.5 Glossary
SLYZ022 TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
156 Device and Documentation Support Copyright © 2012–2015, Texas Instruments Incorporated
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