Datasheet

Memory Test Algorithms on the On-chip ROM

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9.4 Memory Test Algorithms on the On-chip ROM

This section provides a brief description for some of the test algorithms used for memory self-test.

1. March13N:

• March13N is the baseline test algorithm for SRAM testing. It provides the highest overall coverage.

The other algorithms provide additional coverage of otherwise missed boundary conditions of the

SRAM operation.

• The concept behind the general march algorithm is to indicate:

– The bit cell can be written and read as both a 1 and a 0.

– The bits around the bit cell do not affect the bit cell.

• The basic operation of the march is to initialize the array to a know pattern, then march a different

pattern through the memory.

• Type of faults detected by this algorithm:

– Address decoder faults

– Stuck-At faults

– Coupled faults

– State coupling faults

– Parametric faults

– Write recovery faults

– Read/write logic faults

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Programmable Built-In Self-Test (PBIST) Module SPNU562–May 2014

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