Datasheet

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8.3.3 L2RAMW Diagnostic Data Vector High Register (DIAG_DATA_VECTOR_H)
The DIAG_DATA_VECTOR_H register, shown in Figure 8-4 and described in Table 8-5, is used in
conjunction with the RAMTEST register to perform diagnostic tests.
Figure 8-4. L2RAMW Diagnostic Data Vector High Register (DIAG_DATA_VECTOR_H)
(offset = 24h)
31 0
DIAGNOSTIC VECTOR[63:32]
R/WP-0
LEGEND: R/W = Read/Write; WP = Write in privilege mode only; -n = value after reset
Table 8-5. L2RAMW Diagnostic Data Vector High Register (DIAG_DATA_VECTOR_H)
Field Descriptions
Bit Field Description
31-0 DIAGNOSTIC VECTOR DIAGNOSTIC VECTOR_H. Used in conjunction with DIAG_DATA_VECTOR_L to form a 64-bit
test vector used for diagnostic test of two SECDEDs (read and write) and compare logic of the
two SECDED malfunctions and merged mux. This register is the upper 32 bits. This register is
used in conjunction with the RAMTEST register to perform diagnostic tests. See Section 8.2.6
for details on how to start a diagnostic test.
8.3.4 L2RAMW Diagnostic Data Vector Low Register (DIAG_DATA_VECTOR_L)
The DIAG_DATA_VECTOR_L, shown in Figure 8-5 and described in Table 8-6, is used in conjunction
with the RAMTEST register to perform diagnostic tests.
Figure 8-5. L2RAMW Diagnostic Vector Low Register (DIAG_DATA_VECTOR_L)
(offset = 28h)
31 0
DIAGNOSTIC VECTOR[31:0]
R/WP-0
LEGEND: R/W = Read/Write; WP = Write in privilege mode only; -n = value after reset
Table 8-6. L2RAMW Diagnostic Vector Low Register (DIAG_DATA_VECTOR_L)
Field Descriptions
Bit Field Description
31-0 DIAGNOSTIC VECTOR DIAGNOSTIC VECTOR_L. Used in conjunction with DIAG_DATA_VECTOR_H to form a 64-bit
test vector used for diagnostic test of two SECDEDs (read and write) and compare logic of the
two SECDED malfunctions and merged mux. This register is the lower 32 bits. This register is
used in conjunction with the RAMTEST register to perform diagnostic tests. See Section 8.2.6
for details on how to start a diagnostic test.
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SPNU562–May 2014 Level 2 RAM (L2RAMW) Module
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