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System and Peripheral Control Registers www.ti.com
2.5.1.28 Die Identification Register Lower Word (DIEIDL)
The DIEIDL register, shown in Figure 2-35 and described in Table 2-47, contains information about the die
lot number, wafer number, and X, Y wafer coordinates.
Figure 2-35. Die Identification Register, Lower Word (DIEIDL) (offset = 7Ch)
31 22 21 16
LOT # (LOWER 10 BITS) WAFER #
R-D R-D
15 8 7 0
Y WAFER COORDINATE X WAFER COORDINATE
R-D R-D
LEGEND: R = Read only; -n = value after reset; -D = device specific
Table 2-47. Die Identification Register, Lower Word (DIEIDL) Field Descriptions
Bit Field Description
31-22 LOT # (Lower 10 Bits) These read only bits contain the lower 10 bits of the device lot number.
21-16 WAFER # These read only bits contain the wafer number of the device.
15-8 Y WAFER COORDINATE These read only bits contain the Y wafer coordinate of the device
7-0 X WAFER COORDINATE These read only bits contain the X wafer coordinate of the device
NOTE: Die Identification Information
The die identification information will vary from unit to unit. This information is programmed
by TI as part of the initial device test procedure.
2.5.1.29 Die Identification Register Upper Word (DIEIDH)
The DIEIDH register, shown in Figure 2-36 and described in Table 2-48, contains information about the
die lot number.
Figure 2-36. Die Identification Register, Upper Word (DIEIDH) (offset = 80h)
31 16
Reserved
R-0
15 14 13 0
Reserved LOT # (UPPER 14 BITS)
R-0 R-D
LEGEND: R/W = Read/Write; R = Read only; D = Value is device dependent; -n = value after reset
Table 2-48. Die Identification Register, Upper Word (DIEIDH) Field Descriptions
Bit Field Description
31-14 Reserved Read returns 0. Writes have no effect.
13-0 LOT # (Upper 14 Bits) This read-only register contains the upper 14 bits of the device lot number.
NOTE: Die Identification Information
The die identification information will vary from unit to unit. This information is programmed
by TI as part of the initial device test procedure.
166
Architecture SPNU562–May 2014
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