Datasheet

Copyright © 2014–2016, Texas Instruments IncorporatedTerminal Configuration and Functions
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TMS570LC4357
SPNS195C –FEBRUARY 2014–REVISED JUNE 2016 www.ti.com
4.2.1.20 Test and Debug Modules Interface
Table 4-22. ZWT Test and Debug Modules Interface
TERMINAL
SIGNAL
TYPE
DEFAULT
PULL STATE
PULL TYPE
OUTPUT
BUFFER
DRIVE
STRENGTH
DESCRIPTION
SIGNAL NAME
337
ZWT
nTRST D18 Input Pulldown 100 µA - JTAG test hardware reset
TCK B18 Input Pulldown Fixed, 100 µA - JTAG test clock
TDI A17 Input Pullup Fixed, 100 µA - JTAG test data in
TDO C18 Output Pulldown Fixed, 100 µA 8mA JTAG test data out
TEST U2 Input Pulldown Fixed, 100 µA -
Test mode enable. This terminal
must be connected to ground directly
or through a pulldown resistor.
TMS C19 Input Pullup Fixed, 100 µA - JTAG test mode select
RTCK A16 Output - - 8mA JTAG return test clock
4.2.1.21 Flash Supply and Test Pads
Table 4-23. ZWT Flash Supply and Test Pads
TERMINAL
SIGNAL
TYPE
DEFAULT
PULL STATE
PULL TYPE
OUTPUT
BUFFER
DRIVE
STRENGTH
DESCRIPTION
SIGNAL NAME
337
ZWT
VCCP F8 3.3-V Power – – – Flash pump supply
FLTP1 J5 Input – – – Flash test pads. These terminals are
reserved for TI use only. For proper
operation these terminals must
connect only to a test pad or not be
connected at all [no connect (NC)].
FLTP2 H5 Input – – –