Datasheet

18
CC1350
SWRS183 –JUNE 2016 www.ti.com
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Specifications Copyright © 2016, Texas Instruments Incorporated
5.12.4 Flash Memory Characteristics
(1) This number is dependent on flash aging and increases over time and erase cycles.
T
c
= 25°C, V
DDS
= 3.0 V, unless otherwise noted.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Supported flash erase cycles before failure 100 k Cycles
Flash page or sector erase current Average delta current 12.6 mA
Flash page or sector erase time
(1)
8 ms
Flash page or sector size 4 KB
Flash write current Average delta current, 4 bytes at a time 8.15 mA
Flash write time
(1)
4 bytes at a time 8 µs
5.12.5 ADC Characteristics
(1) Using IEEE Std 1241™ 2010 for terminology and test methods.
(2) Input signal scaled down internally before conversion, as if voltage range was 0 to 4.3 V. Applied voltage must be within the absolute
maximum ratings (see Section 5.1) at all times.
(3) No missing codes. Positive DNL typically varies from 0.3 to 1.7, depending on the device (see Figure 5-7).
(4) For a typical example, see Figure 5-6.
T
c
= 25°C, V
DDS
= 3.0 V, DC-DC disabled. Input voltage scaling enabled, unless otherwise noted
(1)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Input voltage range 0 V
DDS
V
Resolution 12 Bits
Sample rate 200 ksamples/s
Offset Internal 4.3-V equivalent reference
(2)
2.1 LSB
Gain error Internal 4.3-V equivalent reference
(2)
–0.14 LSB
DNL
(3)
Differential nonlinearity >–1 LSB
INL
(4)
Integral nonlinearity ±2 LSB
ENOB Effective number of bits
Internal 4.3-V equivalent reference
(2)
, 200 ksamples/s,
9.6-kHz input tone
10.0
BitsVDDS as reference, 200 ksamples/s, 9.6-kHz input tone 10.2
Internal 1.44-V reference, voltage scaling disabled,
32 samples average, 200 ksamples/s, 300-Hz input tone
11.1
THD Total harmonic distortion
Internal 4.3-V equivalent reference
(2)
, 200 ksamples/s,
9.6-kHz input tone
–65
dBVDDS as reference, 200 ksamples/s, 9.6-kHz input tone –72
Internal 1.44-V reference, voltage scaling disabled,
32 samples average, 200 kspksamples/s, 300-Hz input tone
–75
SINAD
and
SNDR
Signal-to-noise and
distortion ratio
Internal 4.3-V equivalent reference
(2)
, 200 ksamples/s,
9.6-kHz input tone
62
dBVDDS as reference, 200 ksamples/s, 9.6-kHz input tone 63
Internal 1.44-V reference, voltage scaling disabled,
32 samples average, 200 ksamples/s, 300-Hz input tone
69
SFDR
Spurious-free dynamic
range
Internal 4.3-V equivalent reference
(2)
, 200 ksamples/s,
9.6-kHz input tone
74
dBVDDS as reference, 200 ksamples/s, 9.6-kHz input tone 75
Internal 1.44-V reference, voltage scaling disabled,
32 samples average, 200 ksamples/s, 300-Hz input tone
75
Conversion time Including sampling time 5 µs
Current consumption Internal 4.3-V equivalent reference
(2)
0.66 mA
Current consumption VDDS as reference 0.75 mA
Reference voltage Internal 4.3-V equivalent reference, voltage scaling enabled
(2)
4.3 V
Reference voltage Internal 4.3-V equivalent reference, voltage scaling disabled
(2)
1.44 V
Reference voltage VDDS as reference, voltage scaling disabled
VDDS /
2.82
V
Reference voltage VDDS as reference, voltage scaling enabled VDDS V
Input Impedance
Capacitive input, Input impedance is depending on sampling time
and can be increased by increasing sampling time
>1 MΩ