Datasheet

( ) ( )
( ) ( )
PHL-m in CC1, CC2, A PLH-m ax CC1 , CC2 , A
P HL -max CC1, CC2, A PLH-m in CC1, CC2, A
min = t V V T t V V T
max = t V V T t V V T
i.e. -
-
( ) ( )
( ) ( )
P H L-max CC1, C C2, A PH L -min CC1, C C2, A
P LH-max CC1, C C2, A PL H-min CC1, C C2, A
t V V T t V V T ,
t V V T t V V T
i.e. max
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ISO5500
www.ti.com SLLSE64C –SEPTEMBER 2011–REVISED JUNE 2013
SWITCHING CHARACTERISTICS
All typical values are at T
A
= 25°C, V
CC1
= 5 V, V
CC2
– V
E
= 30 V, V
E
– V
EE-P
= 0 V (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
t
PLH
, t
PHL
Propagation Delay 150 200 300 ns
R
G
= 10 Ω, C
G
= 10 nF,
t
sk-p
Pulse Skew |t
PHL
– t
PLH
| 1.7 10 ns
50 % duty cycle, 10 kHz input,
V
CC2
– V
EE
= 30 V,
t
sk-pp
Part-to-part skew
(1)
45 ns
V
E
– V
EE
= 0 V, See Figure 16
t
sk2-pp
Part-to-part skew
(2)
–50 50 ns
through Figure 19, Figure 26,
t
r
Output signal rise time Figure 47, Figure 49, and 55 ns
Figure 50
t
f
Output signal fall time 10 ns
t
DESAT (90%)
DESAT sense to 90% VOUT delay 300 550 ns
R
G
= 10 Ω, C
G
= 10 nF,
t
DESAT (10%)
DESAT sense to 10% VOUT delay 1.8 2.3 μs
V
CC2
– V
EE-P
= 30 V,
t
DESAT (FAULT)
DESAT sense to FAULT low output delay 290 550 ns
V
E
– V
EE-P
= 0 V, See Figure 20
DESAT sense to DESAT low propagation
through Figure 25, Figure 48 and
t
DESAT (LOW)
180 ns
delay
Figure 51
t
RESET (FAULT)
RESET to high-level FAULT signal delay 3 8.2 13 μs
t
UVLO (ON)
UVLO to V
OUT
high delay 1ms ramp from 0 V to 30 V 4 μs
t
UVLO (OFF)
UVLO to V
OUT
low delay 1ms ramp from 30 V to 0 V 6 μs
Failsafe output delay time from input power
t
FS
2.8 μs
loss
(1) t
sk-pp
is the maximum difference in same edge propagation delay times (either V
IN+
to V
OUT
or V
IN–
to V
OUT
) between two devices
operating at the same supply voltage, same temperature, and having identical packages and test circuits.
(2) t
sk2-pp
is the propagation delay difference in high-to-low to low-to-high transition ( any of the combinations V
IN+
to V
OUT
or V
IN–
to V
OUT
)
between two devices operating at the same supply voltage, same temperature, and having identical packages and test circuits.
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