Datasheet

ISO3086T
SLLSE27C JANUARY 2011 REVISED JULY 2011
www.ti.com
SUPPLY CURRENT and COMMON-MODE TRANSIENT IMMUNITY
over recommended operating conditions (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
V
CC1
= 3.3 V ±10% 5 8 mA
Logic-side quiescent DE and RE = 0V or V
CC1
(Driver and Receiver
I
CC1
(1)
supply current Enabled or Disabled), D = 0 V or V
CC1
, No load
V
CC1
= 5 V ±10% 7 12
RE = 0 V or V
CC1
, DE = 0 V (driver disabled), No load 10 15 mA
Bus-side quiescent
I
CC2
(1)
supply current
RE = 0 V or V
CC1
, DE = V
CC1
(driver enabled), D = 0 V or V
CC1
, No Load 10 15
Common-mode
CMTI See Figure 13, V
I
= V
CC1
or 0 V 25 50 kV/µs
transient immunity
(1) I
CC1
and I
CC2
are measured when device is connected to external power supplies, V
CC1
and V
CC2
. In this case, D1 and D2 are open and
disconnected from external transformer.
DRIVER ELECTRICAL CHARACTERISTICS
over recommended operating conditions (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
I
O
= 0 mA, no load 3 4.3 V
CC2
R
L
= 54 Ω (RS-485), See Figure 2 1.5 2.3
|V
OD
| Differential output voltage magnitude V
R
L
= 100 Ω (RS-422), See Figure 2 2 2.3
V
test
from 7 V to +12 V, SeeFigure 3 1.5
Change in magnitude of the differential
Δ|V
OD
| See Figure 2 and Figure 3 0.2 0 0.2 V
output voltage
V
OC(SS)
Steady-state common-mode output voltage 1 2.6 3 V
Figure 4
Change in steady-state common-mode
ΔV
OC(SS)
0.1 0.1 V
output voltage
V
OC(pp)
Peak-to-peak common-mode output voltage See Figure 4 0.5 V
I
I
Input current D, DE, V
I
at 0 V or V
CC1
10 10 µA
V
Y
or V
Z
= 12V,
1
V
CC2
= 0 V or 5 V, DE = 0 V
High-impedance state output current, Y or Z Other bus pin
I
OZ
µA
pin at 0 V
V
Y
or V
Z
= 7 V,
1
V
CC2
= 0 V or 5 V, DE = 0 V
Other bus pin
I
OS
(1)
Short-circuit output current 7 V V
Y
or V
Z
12 V 250 250 mA
at 0 V
(1) This device has thermal shutdown and output current limiting features to protect in short-circuit fault condition.
DRIVER SWITCHING CHARACTERISTICS
over recommended operating conditions (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
t
PLH
, t
PHL
Propagation delay 25 45
PWD
(1)
Pulse width distortion (|t
PHL
t
PLH
|) See Figure 5 1 7.5 ns
t
r
, t
f
Differential output signal rise time and fall time 7 15
t
PZH
, Propagation delay, high-impedance-to-high-level output, See Figure 6
25 55 ns
t
PHZ
Propagation delay, high-level-to-high-impedance output DE at 0 V
t
PLZ
, Propagation delay, low-level to high-impedance output, See Figure 7,
25 55 ns
t
PZL
Propagation delay, high-impedance to low-level output DE at 0 V
(1) Also known as pulse skew
4 Copyright © 2011, Texas Instruments Incorporated