Datasheet
Input
I
I
V
I
V
CC1
DE
A
B
V
OB
V
OA
V
OD
I
OA
I
OB
GND2
GND1
GND1
GND2
V
OC
27 W
V
OC
B
V
B
V
A
A
V
OC(SS)
OC(p-p)
V
27 W
Generator: PRR= 100 kHz, 50 % duty
cycle, t
r
< 6ns, t
f
<6 ns,Z
O
= 50 W
Input
V
OD
50 W
D
A
B
DE
V
CC1
V
I
Input
Generator
Generator: PRR =100 kHz, 50 % duty
cycle
,
t
r
< 6ns , t
f
<6 ns ,Z
O
= 50
3V
t
f
t
r
t
PLH
t
PHL
10%
90%
V
OD
V
I
90%
10%
V
OD(H)
V
OD(L)
includesfixtureand
instrumentationcapacitance
L
C
50%50%
GND1
R =54
±1%
L
W
C =50pF
±20%
L
50% 50%
Input
Generator
50 W
3 Viftesting A output,
0 ViftestingBoutput
S1
C
L
includesfixtureand
instrumentation
capacitance
D
A
DE
50% 50%
3 V
V
OH
t
PZH
t
PHZ
50%
90%
0 V
V
O
V
I
3Vor0V
V
I
GND1
V
O
C =50pF±20%
L
R =110
±1%
L
W
GeneratorPRR=50kHz,50%dutycycle,
t <6ns,t <6ns,Z =50
r f O
W
0V
~
~
ISO3080, ISO3086
ISO3082, ISO3088
www.ti.com
SLOS581E – MAY 2008–REVISED SEPTEMBER 2011
PARAMETER MEASUREMENT INFORMATION (continued)
Figure 3. Test Circuit and Waveform Definitions For The Driver Common-Mode Output Voltage
Figure 4. Driver Switching Test Circuit and Voltage Waveforms
Figure 5. Driver High-Level Output Enable and Disable Time Test Circuit and Voltage Waveforms
Copyright © 2008–2011, Texas Instruments Incorporated Submit Documentation Feedback 5
Product Folder Link(s): ISO3080, ISO3086 ISO3082, ISO3088