Datasheet
I
OS
D
A
B
V
os
I
OS
time
60
250
120
GND2GND1
DE
GND2
t
(CFB)
t
(TSD)
OutputCurrent-mA
V
OD
50 W
D
A
B
DE
V
I
Input
Generator
90%
GND1
V
CC1
R =54
±1%
L
W
C =50pF
±20%
L
C IncludesFixtureand
InstrumentationCapacitance
L
GeneratorPRR=500kHz,50%Duty
Cycle,t <6ns,Z =50
r O
W
V
I
V
OD
3V
1.5V 1.5V
t
PLH
t
PHL
V
OD(H)
V
OD(L)
90%
0V
0V
10%
10%
t
r
t
f
50 W
D
A
B
DE
V
I
Input
Generator
GND1
V
OA
V
OB
50%
V
O
A
B
V
CC1
GND2
R =54
±1%
L
W
C =50pF
±20%
L
t
t(MHL)
t
t(MLH)
50%
50%
50%
C IncludesFixtureand
InstrumentationCapacitance
L
GeneratorPRR=500kHz,50%Duty
Cycle,t <6ns,t <6ns,Z =50
r f O
W
DE
A
B
50 %
50 %
0V
Signal
Generator
50 W
DE
B
A
D
GND 1 GND 2
V
OAV
OB
V =0V
IN
R =110
L
W
C =50pF
L
R =110
L
W
C =50pF
L
V
CC2
t
(AZL)
t
(BZH)
1.5V
t
(ALZ)
t
(BHZ)
V +0.5V
OL
V -0.5V
O
GeneratorPRR=500kHz,50%Duty
Cycle,t <6ns,t <6ns,Z =50
r f O
W
ISO1176
SLLS897D –MARCH 2008–REVISED MARCH 2010
www.ti.com
PARAMETER MEASUREMENT INFORMATION (continued)
Figure 9. I
OS(SS)
Steady State Short Circuit Output Current Test Circuit
Figure 10. Driver Switching Test Circuit and Waveforms
Figure 11. Driver Output Transition Skew Test Circuit and Waveforms
Figure 12. Driver Enable/Disable Test, D at Logic Low Test Circuit and Waveforms
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Product Folder Link(s) :ISO1176