Datasheet

TXD
RXD
15pF
+
V
O
± 20%
W60
CANH
CANL
±1%
C
L
NOTE: C
L
= 100pF
includesinstrumentation
andfixturecapacitance
within± 20%.
V
CC 2
V
I
0 V
GND 1
V
OH
V
CC2
0 V
t
fs
V
O
V
I
2.7 V
V
OL
50%
I
OS
TXD
-12 Vor 12 V
0 VorV
CC 1
CANH
CANL
V
I
GND2
I
OS (P)
I
OS (SS)
15 s
V
I
10 ms
0 V
0 V
12 V
-12 V
or
0 V
V
I
ISO1050
www.ti.com
SLLS983H JUNE 2009REVISED JUNE 2013
Figure 14. Driver Short-Circuit Current Test Circuit and Waveforms
Figure 15. Failsafe Delay Time Test Circuit and Voltage Waveforms
Copyright © 2009–2013, Texas Instruments Incorporated Submit Documentation Feedback 13
Product Folder Links: ISO1050