Datasheet

INA827
SBOS631A –JUNE 2012–REVISED JULY 2013 www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
PACKAGE AND ORDERING INFORMATION
(1)
PACKAGE PACKAGE ORDERING TRANSPORT MEDIA,
PRODUCT PACKAGE-LEAD DESIGNATOR MARKING NUMBER QUANTITY
INA827AIDGK Tape and Reel, 250
INA827 MSOP-8 DGK IPSI
INA827AIDGKR Tape and Reel, 3000
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the
device product folder at www.ti.com.
ABSOLUTE MAXIMUM RATINGS
(1)
VALUE UNIT
Supply ±20 V
Voltage
Input ±40 V
REF input ±20 V
Output short-circuit
(2)
Continuous
Operating, T
A
–55 to +150 °C
Temperature range Storage, T
stg
–65 to +150 °C
Junction, T
J
+175 °C
Electrostatic discharge (ESD) rating Human body model (HBM) 2000 V
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not implied.
(2) Short-circuit to V
S
/ 2.
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