Datasheet

1
2
3
4
8
7
6
5
IN+
NC
(1)
V+
OUT
IN-
GND
PREOUT
BUFIN
INA27x
INA270
INA271
SBOS381C –FEBRUARY 2007–REVISED MAY 2010 www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ORDERING INFORMATION
(1)
PACKAGE PACKAGE
PRODUCT PACKAGE-LEAD DESIGNATOR GAIN MARKING
INA270 SO-8 D 14 I270A
INA271 SO-8 D 20 I271A
(1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
ABSOLUTE MAXIMUM RATINGS
(1)
INA270, INA271 UNIT
Supply Voltage (V
S
) +18 V
Analog Inputs, V
IN+
, V
IN–
:
Differential, (V
IN+
) – (V
IN–
) –18 to +18 V
Common-Mode –16 to +80 V
Analog Output:
OUT and PRE OUT Pins GND – 0.3 to (V+) + 0.3 V
Input Current Into Any Pin 5 mA
Operating Temperature –55 to +150 °C
Storage Temperature –65 to +150 °C
Junction Temperature +150 °C
ESD Ratings:
Human Body Model 3000 V
Charged-Device Model 750 V
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not supported.
PIN CONFIGURATION
SO-8
Top View
NOTE (1): NC denotes no internal connection.
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