Datasheet

www.ti.com
INA216EVM Circuit
3.5 U1
U1 is the location for the test device, as shown in Figure 9. Four device boards are supplied with the
INA216EVM board; each device board is populated with one of the available device gains. This
interchangeable option allow users to test the devices and determine the gain setting that is best suited for
a given application.
Figure 10 shows the U1 slot populated with a DIP board device as an example.
Figure 9. U1 Footprint
Figure 10. U1 Populated With DIP Board
9
SBOU086 August 2011 INA216EVM
Submit Documentation Feedback
Copyright © 2011, Texas Instruments Incorporated