Datasheet

INA138-Q1, INA168-Q1
SGLS174G –SEPTEMBER 2003–REVISED JANUARY 2013 www.ti.com
ORDERING INFORMATION
(1)
SPECIFIED
PACKAGE PACKAGE TRANSPORT
PRODUCT PACKAGE−LEAD TEMPERATURE
DESIGNATOR
(2)
MARKING MEDIA, QUANTITY
RANGE
INA138QPWRQ1 TSSOP−8 PW −40°C to 125°C INA138 Tape and reel, 2000
INA168QPWRQ1 TSSOP−8 PW −40°C to 125°C INA168 Tape and reel, 2000
INA168QDBVRQ1 SOT23-5 DBV −40°C to 125°C LUIQ Tape and reel, 3000
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
Web site at www.ti.com.
(2) Package drawings, thermal data, and symbolization are available at www.ti.com/packaging.
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ABSOLUTE MAXIMUM RATINGS
(1)
over operating free-air temperature range (unless otherwise noted)
VALUE
Supply voltage, V
+
INA138-Q1 −0.3 V to 60 V
INA168-Q1 −0.3 V to 75 V
Analog inputs, V
IN+
, V
IN−
, common-mode INA138-Q1 −0.3 V to 60 V
INA168-Q1 −0.3 V to 75 V
Analog inputs, (V
IN+
) − (V
IN−
), differential −40 V to 2 V
Analog output, out −0.3 V to 40 V
Operating temperature −55°C to 150°C
Storage temperature −65°C to 150°C
Junction temperature 150°C
Thermal resistance, junction-to-ambient, R
ΘJA
PW 150°C/W
DBV 200°C/W
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating
Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
ELECTRICAL CHARACTERISTICS
TA
= −40°C to 125°C, V
S
= 5 V, V
IN+
= 12 V, and R
OUT
= 125 kΩ unless otherwise noted
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Input
Full-scale sense voltage V
SENSE
= V
IN+
– V
IN−
100 500 mV
Common-mode input range INA138-Q1 2.7 36
V
INA168-Q1 2.7 60
Common-mode rejection V
IN+
= 2.7 V to 36 V, V
SENSE
INA138-Q1
100 120
= 50 mV
dB
V
IN+
= 2.7 V to 60 V, V
SENSE
INA168-Q1
100 120
= 50 mV
Offset voltage
(1)
±0.2 ±2 mV
Offset voltage versus temperature 1 μV/°C
Offset voltage versus power supply, V
+
= 2.7 V to 36 V, V
SENSE
= INA138-Q1
0.1 10
V
+
50 mV
μV/V
V
+
= 2.7 V to 60 V, V
SENSE
= INA168-Q1
0.1 10
50 mV
Input bias current VI
N+
= V
IN−
= 12 V 10 μA
(1) Defined as the amount of input voltage, V
SENSE
, to drive the output to zero.
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Product Folder Links: INA138-Q1 INA168-Q1