Datasheet

INA159
SBOS333B − JULY 2005 − REVISED OCTOBER 2005
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4
20k
Ω
40k
Ω
100k
Ω
2
3
7
5
OUT
1
8
6
V+
4
V
−
+5V
100k
Ω
40k
Ω
INA159
The test is performed by
measuring the output
with the reference
appliedtoalternate
reference resistors, and
calculating a result such
that the amplifier offset is
cancelled in the final
measurement.
Figure 2. Test Circuit for Reference Divider Accuracy
TYPICAL CHARACTERISTICS
At T
A
= +25°C, R
L
= 10kΩ connected to V
S
/2, REF pin 1 connected to ground, and REF pin 2 connected to V
REF
= 5V, unless otherwise noted.
OFFSET VOLTAGE PRODUCTION DISTRIBUTION
Offset Voltage (
µ
V)
Population
−
500
−
450
−
400
−
350
−
300
−
250
−
200
−
150
−
100
−
50
0
50
100 150 200 250 300 350 400 450 500
OFFSET VOLTAGE DRIFT PRODUCTION DISTRIBUTION
Offset Voltage Drift (
µ
V/
_
C)
Population
−
10
−
9
−
8
−
7
−
6
−
5
−
4
−
3
−
2
−
1
0 1 2 3 4 5 6 7 8 9
10
GAIN vs FREQUENCY
Frequency (Hz)
Gain (dB)
0
−
10
−
20
−
30
−
40
−
50
100 1k 10k 100k 1M 10M
10
POWER−SUPPLY REJECTION RATIO vs FREQUENCY
Frequency (Hz)
PSRR (dB)
130
120
110
100
90
80
70
60
50
40
30
20
10
0
−
10
100 1k 10k 100k 1M 10M10