Datasheet

INA148-Q1
SBOS472A –MARCH 2009–REVISED OCTOBER 2011 www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ABSOLUTE MAXIMUM RATINGS
(1)
over operating free-air temperature range (unless otherwise noted)
V
S
Supply voltage, V+ to V– 36 V
Continuous ±200 V
V
IN
Input voltage
Peak (0.1 second) ±500 V
t
SS
Short circuit to ground duration Continuous
θ
JA
Package thermal impedance, junction to free air 97.1°C/W
T
A
Operating free-air temperature range –40°C to 125°C
T
J
Maximum operating virtual-junction temperature 150°C
T
stg
Storage temperature range –65°C to 150°C
T
lead
Lead temperature range (soldering, 10 seconds) 300°C
Human-Body Model (HBM) 1500 V
ESD Electrostatic discharge rating Machine Model (MM) 150 V
Charged-Device Model (CDM) 2000 V
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
RECOMMENDED OPERATING CONDITIONS
MIN MAX UNIT
Single supply 2.7 36
V
S
Supply voltage V
Dual supply ±1.35 ±18
T
A
Operating free-air temperature –40 125 °C
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