Datasheet

Four-bit Instruction Register (IR) chain for storing JTAG instructions
IEEE standard instructions: BYPASS, IDCODE, SAMPLE/PRELOAD, and EXTEST
ARM additional instructions: APACC, DPACC and ABORT
Integrated ARM Serial Wire Debug (SWD)
Serial Wire JTAG Debug Port (SWJ-DP)
Flash Patch and Breakpoint (FPB) unit for implementing breakpoints
Data Watchpoint and Trace (DWT) unit for implementing watchpoints, trigger resources, and
system profiling
Instrumentation Trace Macrocell (ITM) for support of printf style debugging
Embedded Trace Macrocell (ETM) for instruction trace capture
Trace Port Interface Unit (TPIU) for bridging to a Trace Port Analyzer
1.3.13 Packaging and Temperature
128-pin RoHS-compliant TQFP package
Industrial (-40°C to 85°C) ambient temperature range
Extended (-40°C to 105°C) ambient temperature range
1.4 TM4C129ENCPDT Microcontroller Hardware Details
Details on the pins and package can be found in the following sections:
“Pin Diagram” on page 1895
“Signal Tables” on page 1896
“Electrical Characteristics” on page 1942
“Package Information” on page 2009
1.5 Kits
The Tiva™ C Series provides the hardware and software tools that engineers need to begin
development quickly.
Reference Design Kits accelerate product development by providing ready-to-run hardware and
comprehensive documentation including hardware design files
Evaluation Kits provide a low-cost and effective means of evaluating TM4C129ENCPDT
microcontrollers before purchase
Development Kits provide you with all the tools you need to develop and prototype embedded
applications right out of the box
June 18, 201484
Texas Instruments-Production Data
Architectural Overview