Datasheet

DS92LX2121, DS92LX2122
SNLS330I MAY 2010REVISED APRIL 2013
www.ti.com
Serializer Electrical Characteristics
(1)(2)(3)
(continued)
Over recommended operating supply and temperature ranges unless otherwise specified.
Symbol Parameter Conditions Min Typ Max Units
I
OS
Output Short Circuit Current V
OUT
= 0V
(4)
Serializer
-11
GPO Outputs
mA
Deserializer
LVCMOS -20
Outputs
I
OZ
TRI-STATE Output Current RPWDNB = 0V, Register -20 ±1 +20 µA
V
OUT
= 0V or V
DD
Address
(OSS_SEL =
0)
CML DRIVER DC SPECIFICATIONS (DOUT+, DOUT-)
R
T
= 100 268 340 412
|V
OD
| Output Differential Voltage mV
(SeeFigure 9)
ΔV
OD
Output Differential Voltage Unbalance R
L
= 100 1 50 mV
R
L
= 100 (See V
DD (MIN)
- V
OD
V
DD
- V
OD
V
DD (MAX)
-
V
OS
Output Differential Offset Voltage V
Figure 9)
(MAX)
V
OD (MIN)
ΔV
OS
Offset Voltage Unbalance RL = 100 1 50 mV
I
OS
Output Short Circuit Current DOUT+/- = 0V, -27 mA
PDB = L or H
(4)
R
T
Differential Internal Termination Differential across 80 100 120
Resistance DOUT+ and
DOUT-
CML RECEIVER DC SPECIFICATIONS (RIN+, RIN-)
V
TH
Differential Threshold High Voltage +90
V
CM
= 1.2V mV
V
TL
Differential Threshold Low Voltage -90
V
IN
Differential Input Voltage Range RIN+ - RIN- 180 mV
V
IN
= V
DD
or 0 V, -20 ±1 +20
I
IN
Input Current µA
V
DD
= 1.89 V
R
T
Differential Internal Termination Differential across 80 100 120
Resistance RIN+ and RIN-
SER/DES SUPPLY CURRENT *DIGITAL, PLL,
AND ANALOG VDDS
RT = 100 62 90
V
DDn
= 1.89
WORST CASE
Serializer (Tx) V
pattern (See
I
DDT
Total Supply Current Mode (includes f = 50 MHz mA
Figure 6)
load current) Default
RT = 100 55
Registers
RANDOM pattern
RT = 100 V
DDIO
= 1.89
WORST CASE V
pattern (See PCLK = 50
2 5
Figure 6) MHz
Default
Serializer (Tx)
Registers
I
DDIOT
VDDIO Supply Current (includes load mA
current)
V
DDIO
= 3.6 V
PCLK = 50
MHz 7 15
Default
Registers
I
DDTZ
V
DD
= 1.89 V 370 775
PDB = 0V; All
I
DDIOTZ
Serializer (Tx) Supply Current Power- V
DDIO
= 1.89
other LVCMOS 55 125 µA
down V
Inputs = 0V
V
DDIO
= 3.6 V 65 135
(4) Specification is guaranteed by characterization and is not tested in production.
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