Datasheet

High High
Low Low
0 V
2.4 V
-2.4 V
50 mV
-50 mV
150 mV
Transition Region
Type 1 Type 2
V
ID
DS91M040
www.ti.com
SNLS283M FEBRUARY 2008REVISED APRIL 2013
PIN DESCRIPTIONS
Number Name I/O, Type Description
1, 3, 5, 7 RO O, LVCMOS Receiver output pin.
26, 28, 13, 15 RE I, LVCMOS Receiver enable pin: When RE is high, the receiver is disabled. When RE is
low, the receiver is enabled. There is a 300 k pullup resistor on this pin.
25, 27, 14, 16 DE I, LVCMOS Driver enable pin: When DE is low, the driver is disabled. When DE is high, the
driver is enabled. There is a 300 k pulldown resistor on this pin.
2, 4, 6, 8 DI I, LVCMOS Driver input pin.
31, DAP GND Power Ground pin and pad.
17, 19, 21, 23 A I/O, M-LVDS Non-inverting driver output pin/Non-inverting receiver input pin
18, 20, 22, 24 B I/O, M-LVDS Inverting driver output pin/Inverting receiver input pin
11, 12, 29, 30 V
DD
Power Power supply pin, +3.3V ± 0.3V
32 FSEN1 I, LVCMOS Failsafe enable pin with a 300 k pullup resistor. This pin enables Type 2
receiver on inputs 0 and 2.
FSEN1 = L --> Type 1 receiver inputs
FSEN1 = H --> Type 2 receiver inputs
9 FSEN2 I, LVCMOS Failsafe enable pin with a 300 k pullup resistor. This pin enables Type 2
receiver on inputs 1 and 3.
FSEN2 = L --> Type 1 receiver inputs
FSEN2 = H --> Type 2 receiver inputs
10 MDE I, LVCMOS Master enable pin. When MDE is H, the device is powered up. When MDE is L,
the device overrides all other control and powers down.
M-LVDS Receiver Types
The EIA/TIA-899 M-LVDS standard specifies two different types of receiver input stages. A type 1 receiver has a
conventional threshold that is centered at the midpoint of the input amplitude, V
ID
/2. A type 2 receiver has a built
in offset that is 100mV greater then V
ID
/2. The type 2 receiver offset acts as a failsafe circuit where open or short
circuits at the input will always result in the output stage being driven to a low logic state.
Figure 1. M-LVDS Receiver Input Thresholds
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
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