Datasheet

DS90UB903Q, DS90UB904Q
www.ti.com SNLS332E –JUNE 2010–REVISED APRIL 2013
Absolute Maximum Ratings
(1)(2)(3)
Supply Voltage – V
DDn
(1.8V) −0.3V to +2.5V
Supply Voltage – V
DDIO
−0.3V to +4.0V
LVCMOS Input Voltage I/O Voltage −0.3V to + (VDDIO + 0.3V)
CML Driver I/O Voltage (V
DD
) −0.3V to +(V
DD
+ 0.3V)
CML Receiver I/O Voltage (V
DD
) −0.3V to (V
DD
+ 0.3V)
Junction Temperature +150°C
Storage Temperature −65°C to +150°C
Maximum Package Power Dissipation Capacity 1/θ
JA
°C/W above +25°
Package Derating
θ
JA
(based on 16 thermal vias) 30.7 °C/W
40 Lead WQFN
θ
JC
(based on 16 thermal vias) 6.8 °C/W
θ
JA
(based on 16 thermal vias) 26.9 °C/W
48 Lead WQFN
θ
JC
(based on 16 thermal vias) 4.4 °C/W
ESD Rating (IEC 61000-4-2) R
D
= 330Ω, C
S
= 150pF
Air Discharge (DOUT+, DOUT-, RIN+, RIN-) ≥±25 kV
Contact Discharge (DOUT+, DOUT-, RIN+, RIN-) ≥±10 kV
ESD Rating (ISO10605) R
D
= 330Ω, C
S
= 150/330pF
ESD Rating (ISO10605) R
D
= 2KΩ, C
S
= 150/330pF
Air Discharge (DOUT+, DOUT-, RIN+, RIN-) ≥±15 kV
Contact Discharge (DOUT+, DOUT-, RIN+, RIN-) ≥±10 kV
ESD Rating (HBM) ≥±8 kV
ESD Rating (CDM) ≥±1 kV
ESD Rating (MM) ≥±250 V
(1) “Absolute Maximum Ratings” indicate limits beyond which damage to the device may occur, including inoperability and degradation of
device reliability and/or performance. Functional operation of the device and/or non-degradation at the Absolute Maximum Ratings or
other conditions beyond those indicated in the Recommended Operating Conditions is not implied. The Recommended Operating
Conditions indicate conditions at which the device is functional; the device should not be operated beyond such conditions.
(2) For soldering specifications: see product folder at www.ti.com
(3) If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/Distributors for availability and
specifications.
Recommended Operating Conditions
(1)
Min Nom Max Units
Supply Voltage (V
DDn
) 1.71 1.8 1.89 V
LVCMOS Supply Voltage (V
DDIO
) 1.71 1.8 1.89 V
OR
LVCMOS Supply Voltage (V
DDIO
) 3.0 3.3 3.6 V
V
DDn
(1.8V) 25 mVp-p
Supply Noise V
DDIO
(1.8V) 25 mVp-p
V
DDIO
(3.3V) 50 mVp-p
Operating Free Air Temperature (T
A
) -40 +25 +105 °C
PCLK Clock Frequency 10 43 MHz
(1) Supply noise testing was done with minimum capacitors (as shown on Figure 37 and Figure 38) on the PCB. A sinusoidal signal is AC
coupled to the VDDn (1.8V) supply with amplitude = 25 mVp-p measured at the device VDDn pins. Bit error rate testing of input to the
Ser and output of the Des with 10 meter cable shows no error when the noise frequency on the Ser is less than 1 MHz. The Des on the
other hand shows no error when the noise frequency is less than 750 kHz.
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Product Folder Links: DS90UB903Q DS90UB904Q