Datasheet
DS32EL0124, DS32ELX0124
SNLS284K –MAY 2008–REVISED APRIL 2013
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LVDS Timing Specifications (continued)
Over recommended operating supply and temperature ranges unless otherwise specified.
(1) (2)
Symbol Parameter Conditions Min Typ Max Units
t
RLA
Deserializer Lock Time
(3)
1.25 Gbps 22
ms
2.5 Gbps 90
3.125 Gbps 115
t
LVSK
LVDS Output Skew LVDS Differential Output Skew 20 ps
between + and - pins
CML Input Timing Specifications
Over recommended operating supply and temperature ranges unless otherwise specified.
(1) (2)
Symbol Parameter Conditions Min Typ Max Units
TOL
JIT
Serial Input Jitter Tolerance RJ = 0.18 UI
DJ = 0.37 UI
SJ increased until failure
1.25 Gbps
f < 10 kHz 30
f > 1 MHz 0.5
UI
2.5 Gbps
f < 10 kHz 50
f > 1 MHz 0.3
3.125 Gbps
f < 10 kHz 70
f > 1 MHz 0.3
(1) The Electrical and Timing Characteristics tables list ensured specifications under the listed Recommended Operating Conditions except
as otherwise modified or specified by the Electrical Characteristics Conditions and/or Notes. Typical specifications are estimations only
and are not ensured.
(2) Typical values represent most likely parametric norms for V
CC
= +3.3V and T
A
= +25°C, and at the Recommended Operation Conditions
at the time of product characterization and are not ensured.
CML Input Electrical Specifications
Over recommended operating supply and temperature ranges unless otherwise specified.
(1) (2)
Symbol Parameter Conditions Min Typ Max Units
V
ID
Differential input voltage
(3)
230 2200 mV
V
IN
Single ended input voltage
(3)
115 1100 mV
I
IN
Input Current -300 50 μA
R
IT
Input Termination 84 100 116 Ω
(1) The Electrical and Timing Characteristics tables list ensured specifications under the listed Recommended Operating Conditions except
as otherwise modified or specified by the Electrical Characteristics Conditions and/or Notes. Typical specifications are estimations only
and are not ensured.
(2) Typical values represent most likely parametric norms for V
CC
= +3.3V and T
A
= +25°C, and at the Recommended Operation Conditions
at the time of product characterization and are not ensured.
(3) Parameter is specified by characterization and is not tested at production.
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