Datasheet

– GPIO
■ Hardware averaging of up to 64 samples
■ Eight digital comparators
■ Converter uses two external reference signals (VREFA+ and VREFA-) or VDDA and GNDA as the
voltage reference
■ Power and ground for the analog circuitry is separate from the digital power and ground
■ Efficient transfers using Micro Direct Memory Access Controller (µDMA)
– Dedicated channel for each sample sequencer
– ADC module uses burst requests for DMA
■ Global Alternate Clock (ALTCLK) resource or System Clock (SYSCLK) can be used to generate
ADC clock
1.3.11.2 Analog Comparators (see page 1915)
An analog comparator is a peripheral that compares two analog voltages and provides a logical
output that signals the comparison result. The TM4C129XNCZAD microcontroller provides three
independent integrated analog comparators that can be configured to drive an output or generate
an interrupt or ADC event.
The comparator can provide its output to a device pin, acting as a replacement for an analog
comparator on the board, or it can be used to signal the application via interrupts or triggers to the
ADC to cause it to start capturing a sample sequence. The interrupt generation and ADC triggering
logic is separate. This means, for example, that an interrupt can be generated on a rising edge and
the ADC triggered on a falling edge.
The TM4C129XNCZAD microcontroller provides three independent integrated analog comparators
with the following functions:
■ Compare external pin input to external pin input or to internal programmable voltage reference
■ Compare a test voltage against any one of the following voltages:
– An individual external reference voltage
– A shared single external reference voltage
– A shared internal reference voltage
1.3.12 JTAG and ARM Serial Wire Debug (see page 217)
The Joint Test Action Group (JTAG) port is an IEEE standard that defines a Test Access Port and
Boundary Scan Architecture for digital integrated circuits and provides a standardized serial interface
for controlling the associated test logic. The TAP, Instruction Register (IR), and Data Registers (DR)
can be used to test the interconnections of assembled printed circuit boards and obtain manufacturing
information on the components. The JTAG Port also provides a means of accessing and controlling
design-for-test features such as I/O pin observation and control, scan testing, and debugging. Texas
Instruments replaces the ARM SW-DP and JTAG-DP with the ARM Serial Wire JTAG Debug Port
(SWJ-DP) interface. The SWJ-DP interface combines the SWD and JTAG debug ports into one
module providing all the normal JTAG debug and test functionality plus real-time access to system
December 13, 201386
Texas Instruments-Advance Information
Architectural Overview