Datasheet

ORDERING INFORMATION
ABSOLUTE MAXIMUM RATINGS
DCH01 Series
SBVS073H – NOVEMBER 2006 – REVISED JANUARY 2009 ........................................................................................................................................... www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
For the most current package and ordering information, see the Package Option Addendum at the end of this
data sheet, or see the TI website at www.ti.com.
Part Numbering Scheme
INPUT OUTPUT PIN TRANSPORT
PRODUCT LINE POWER VOLTAGE VOLTAGE SINGLE/DUAL PACKAGE CONFIG MEDIA
DCH 01 05 05 S N 7
H = 3 kV, unregulated output 01 = 1 W 05 = 5 V 05 = 5 V S = Single N = SIP Thru-hole 7 = SIP-7 Blank = Tray
12 =12 V D = Dual T = Tape & Reel
15 = 15 V
DCH01 Products
OUTPUT OUTPUT ISOLATION
INPUT VOLTAGE VOLTAGE CURRENT OUTPUT POWER VOLTAGE
MODEL (V) (V) (mA) (W) (kVDC) PACKAGE-LEAD
DCH010505S 5 ± 10% 5 200 1 3 SIP-7
DCH010512S 5 ± 10% 12 83 1 3 SIP-7
DCH010515S 5 ± 10% 15 67 1 3 SIP-7
DCH010505D 5 ± 10% ± 5 ± 100 1 3 SIP-7
DCH010512D 5 ± 10% ± 12 ± 42 1 3 SIP-7
DCH010515D 5 ± 10% ± 15 ± 33 1 3 SIP-7
over operating free-air temperature range (unless otherwise noted)
(1)
DCH01 SERIES UNIT
Input Voltage 5V input models 7 V
Wave soldering
Surface temperature of module body or pins for 5 seconds maximum 260 ° C
temperature
Storage temperature range – 55 to +125 ° C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated is not implied. Exposure to absolute
maximum rated conditions for extended periods may affect device reliability.
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