Datasheet

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ABSOLUTE MAXIMUM RATINGS
(1)
DAC8806
SBAS385B – APRIL 2006 – REVISED FEBRUARY 2008
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ORDERING INFORMATION
(1)
MINIMUM
RELATIVE DIFFERENTIAL PACKAGE- SPECIFIED
ACCURACY NONLINEARITY LEAD TEMPERATURE PACKAGE ORDERING TRANSPORT MEDIA,
PRODUCT (LSB) (LSB) (DESIGNATOR) RANGE MARKING NUMBER QUANTITY
DAC8806IDB Tubes, 48
DAC8806I ± 1 ± 1 DB-28 (SSOP) – 40 ° C to +85 ° C DAC8806
DAC8806IDBR Tape and Reel, 2000
(1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com .
Over operating free-air temperature range (unless otherwise noted)
DAC8806 UNIT
V
DD
to GND – 0.3 to +7 V
Digital input voltage to GND – 0.3 to +V
DD
+ 0.3 V
V (I
OUT
) to GND – 0.3 to +V
DD
+ 0.3 V
Operating temperature range – 40 to +85 ° C
REF, R
OFS
, R
FB
, R1, R
COM
to AGND, and DGND ± 25 V
Storage temperature range – 65 to +150 ° C
Junction temperature range (T
J
max) +125 ° C
Power dissipation (T
J
max – T
A
)/R
θ JA
W
Thermal impedance, R
θ JA
55 ° C/W
Human body model (HBM) 4000 V
ESD rating
Charged device model (CDM) 1000 V
(1) Stresses above those listed under absolute maximum ratings may cause permanent damage to the device. Exposure to absolute
maximum conditions for extended periods may affect device reliability.
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