Datasheet

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ABSOLUTE MAXIMUM RATINGS
DAC8805
SBAS391A – DECEMBER 2006 – REVISED MAY 2007
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be
more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
ORDERING INFORMATION
(1)
RELATIVE DIFFERENTIAL SPECIFIED
ACCURACY NONLINEARITY PACKAGE-LEAD TEMPERATURE PACKAGE
PRODUCT (LSB) (LSB) (DESIGNATOR) RANGE MARKING
TSSOP-38
DAC8805Q ± 1 ± 1 –40 ° C to +125 ° C DAC8805
(DBT)
(1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com .
over operating free-air temperature range (unless otherwise noted)
(1)
DAC8805 UNIT
V
DD
to GND –0.3 to +7 V
Digital input voltage to GND –0.3 to +V
DD
+ 0.3 V
V (I
OUT
) to GND –0.3 to +V
DD
+ 0.3 V
REF, R
OFS
, R
FB
, R
1
, R
COM
to AGND, DGND ± 25 V
Operating temperature range –40 to +125 ° C
Storage temperature range –65 to +150 ° C
Junction temperature range (T
J
max) +150 ° C
Power dissipation (T
J
max – T
A
) / R
θ JA
W
Thermal impedance, R
θ JA
53 ° C/W
Human Body Model (HBM) 4000 V
ESD rating
Charged Device Model (CDM) 500 V
(1) Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. Exposure to absolute
maximum conditions for extended periods may affect device reliability.
2
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