Datasheet

DAC8581
SLAS481C AUGUST 2005REVISED OCTOBER 2012
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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
PACKAGE/ORDERING INFORMATION
(1)
PACKAGE SPECIFICATION PACKAGE
DRAWING TEMPERATURE ORDERING ORDERING TRANSPORT MEDIA,
PRODUCT PACKAGE NUMBER RANGE MARKING NUMBER QUANTITY
DAC8581IPW Tube, 90-Piece
DAC8581 TSSOP-16 PW –40°C to +85°C D8581I
DAC8581IPWR Tape and Reel, 2000-Piece
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
ABSOLUTE MAXIMUM RATINGS
(1)
UNIT
AV
DD
or DV
DD
to AV
SS
–0.3 V to 12 V
Digital input voltage to AV
SS
–0.3 V to 12 V
V
OUT
or V
REF
to AV
SS
–0.3 V to 12 V
DGND and AGND to AV
SS
–0.3 V to 6 V
Operating temperature range –40°C to +85°C
Storage temperature range –65°C to +150°C
Junction temperature range (T
J
max) +150°C
Thermal impedance (θ
JA
) 118°C/W
Power dissipation
Thermal impedance (θ
JC
) 29°C/W
(1) Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. Exposure to absolute
maximum conditions for extended periods may affect device reliability.
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