Datasheet

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ELECTRICAL CHARACTERISTICS
DAC8571
SLAS373A DECEMBER 2002 REVISED JULY 2003
V
DD
= +2.7 V to +5.5 V; R
L
= 2 k to GND; C
L
= 200 pF to GND; low power mode; all specifications -40 °C to 105 °C (unless
otherwise noted)
DAC8571
PARAMETER CONDITIONS MIN TYP MAX UNITS
STATIC PERFORMANCE
(1)
Resolution 16 Bits
Relative accuracy ±0.098 % of FSR
Differential nonlinearity Monotonic by design ±0.25 ±1 LSB
Offset error Measured at code 485, 25 °C 0.3 ±1.0 mV
Measured at code 485, -40 °C...105 °C 1.0 ±5.0
Full-scale error Measured at code 64714, 25 °C 0.5 ±3.0 mV
Measured at code 64714, -40 °C...105 °C 1.0 ±5.0
Gain error Measured at code 64714, 25 °C 1.0 ±3.0 mV
Measured at code 64714, -40 °C...105 °C 2.0 ±5.0
Zero code error drift All zeroes loaded to DAC register -20 µV/ °C
Gain temperature coefficient -5 ppm of FSR/ °C
Absolute accuracy All codes from code 485 to code 64714, 25 °C ±2.5 mV
All codes from code 485 to code 64714, ±3.5
-40 °C...105 °C
OUTPUT CHARACTERISTICS
(2)
Output voltage range 0 V
REF
V
Output voltage settling time (full R
L
= 2 k ; C
L
< 200 pF, fast settling 8 10 µs
scale)
R
L
= 2 k ; C
L
= 500 pF, fast settling 12 µs
R
L
= 2 k ; C
L
< 200 pF, low power 13 15 µs
Slew rate R
L
= 2 k ; C
L
< 200 pF, fast settling 1 V/ µs
R
L
= 2 k ; C
L
< 200 pF, low power 0.5
Capacitive load stability R
L
= 470 pF
R
L
= 2 k 1000 pF
Digital-to-analog glitch impulse 20 nV-s
Digital feedthrough 0.5 nV-s
DC output impedance 1
Short circuit current V
DD
= +5 V 50 mA
V
DD
= +3 V 20 mA
Power-up time Coming out of power-down mode, V
DD
= +5 V 2.5 µs
Coming out of power-down mode, V
DD
= +3 V 5 µs
PSRR 0.75 mV/V
REFERENCE INPUT
V
REFH
input range 0 V
DD
V
Reference input impedance 140 k
LOGIC INPUTS
(2)
Input current ±1 µA
V
IN_L
, Input low voltage V
DD
= 2.7-5.5 V 0.3V
DD
V
V
IN_H0
, Input high voltage V
DD
= 2.7-5.5 V 0.7V
DD
V
Pin capacitance 3 pF
POWER REQUIREMENTS
V
DD
2.7 5.5 V
I
DD
(normal operation) DAC active, I
ref
included
(1) Linearity calculated using a reduced code range of 485 to 64714. Output unloaded.
(2) Assured by design and characterization, not production tested.
3